| Literature DB >> 29210982 |
Hee Jun Shin1, Min-Cheol Lim2, Kisang Park3,4, Sae-Hyung Kim5, Sung-Wook Choi6, Gyeongsik Ok7.
Abstract
We experimentally modulate the refractive index and the absorption coefficient of an SU-8 dry film in the terahertz region by UV light (362 nm) exposure with time dependency. Consequently, the refractive index of SU-8 film is increased by approximately 6% after UV light exposure. Moreover, the absorption coefficient also changes significantly. Using the reflective terahertz imaging technique, in addition, we can read security information printed by UV treatment on an SU-8 film that is transparent in the visible spectrum. From these results, we successfully demonstrate security printing and reading by using photoresist materials and the terahertz technique. This investigation would provide a new insight into anti-counterfeiting applications in fields that need security.Entities:
Keywords: anti-counterfeiting; photoresist material; security; terahertz spectroscopy
Year: 2017 PMID: 29210982 PMCID: PMC5750789 DOI: 10.3390/s17122825
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1(a) Scheme of the UV exposure on the SU-8 photoresist and (b) cross-linking processing after UV illumination.
Figure 2The refractive index on SU-8: (a) before and (b) after UV light (362 nm) treatment with an exposure time of 20 min; (c) The refractive index change ratio of SU-8 after UV exposure at visible, UV (351 nm), IR (1550 nm), and THz (0.5 THz) regions; (d) scheme of chemical change in SU-8 after UV light treatment.
Figure 3The absorption coefficient of the SU-8 film before and after UV exposure.
Figure 4The change ratio of the refractive indices of polyethylene (PE), polyethylene terephthalate (PET), polyimide (PI), polymethylpentene (TPX), and SU-8 at 0.5 THz.
Figure 5(a) The reflective THz pulse at UV non-treated and treated SU-8 area. The images of characters patterned on SU-8 film by (b) optical; (c) reflective THz pulses; (d) 400 GHz and (e) 700 GHz frequency; (f) an experimental scheme and real image of THz reflective imaging; (g) schematic of phase delay and absorption before and after UV treatment.