Lihua Shen1, Sarah S D Lafleur1, Simon J A Houben1, Jeffrey N Murphy1, John R Severn1,2, Cees W M Bastiaansen1,3. 1. Laboratory of Functional Organic Materials and Devices, Eindhoven University of Technology , P.O. Box 513, 5600 MB Eindhoven, The Netherlands. 2. DSM Materials Science Center , NL-6160 MD Geleen, The Netherlands. 3. School of Engineering and Materials Science, Queen Mary University of London , London E1 4NS, U.K.
Abstract
A new procedure is presented for direct generation of surface micropatterns on uniaxially oriented polyethylene (PE) films using interference holography with a nanosecond pulsed laser. An ultraviolet absorber, 2-(2H-benzotriazol-2-yl)-4,6-di-tert-pentylphenol (BZT) is incorporated into PE prior to stretching to generate absorption at the wavelength of the laser. Illumination with an interference pattern in the absorption band of BZT leads to an obvious height variation in the exposed regions and consequently relief gratings are generated. The height in the exposed regions is strongly dependent on the angle between the grating direction and the film orientation direction. This phenomenon is attributed to a combination of events such as melting, entropic contraction, recrystallization, thermal evaporation of BZT, and anisotropic thermal conductivity. It is shown that the relief height increases with increasing BZT concentration and exhibits a linear dependence on the energy dose above a certain threshold. Additionally, the oriented PE films with the surface micropatterns are explored for strain sensors. The results demonstrate that small strains below 10% are monitored accurately in tensile deformation of the micropatterned, oriented PE films which makes these films potentially useful as strain sensors.
A new procedure is presented for direct generation of surface micropatterns on uniaxially oriented polyethylene (PE) films using interference holography with a nanosecond pulsed laser. An ultraviolet absorber, 2-(2H-benzotriazol-2-yl)-4,6-di-tert-pentylphenol (BZT) is incorporated into PE prior to stretching to generate absorption at the wavelength of the laser. Illumination with an interference pattern in the absorption band of BZT leads to an obvious height variation in the exposed regions and consequently relief gratings are generated. The height in the exposed regions is strongly dependent on the angle between the grating direction and the film orientation direction. This phenomenon is attributed to a combination of events such as melting, entropic contraction, recrystallization, thermal evaporation of BZT, and anisotropic thermal conductivity. It is shown that the relief height increases with increasing BZT concentration and exhibits a linear dependence on the energy dose above a certain threshold. Additionally, the oriented PE films with the surface micropatterns are explored for strain sensors. The results demonstrate that small strains below 10% are monitored accurately in tensile deformation of the micropatterned, oriented PE films which makes these films potentially useful as strain sensors.
The ability to micropattern
polymeric materials with predesigned
surface structures is of great significance in a wide range of applications
including sensors,[1,2] tissue engineering,[3−6] lab-on-a-chip (LoC) devices,[7] and biofouling.[8,9] A large variety of micropatterning strategies have been developed
based on soft lithography,[10−12] holography,[13,14] spatial light modulator (SLM),[15] inkjet
printing,[16−19] direct laser interference patterning (DLIP),[20−25] and micro- and nanoprinting techniques.[26−28] Among these
technologies, interference holography is a facile, inexpensive, and
maskless technology to generate periodic structures in a photoresist
layer.[29,30] Typically, a laser beam is split into two
beams with identical linear polarizations from which an interference
pattern is created with a pitch determined by the angle between two
interfering laser beams.[31] In the past,
both negative and positive photoresist materials were employed extensively
in interference holography to generate the microstructures in isotropic
monomers and polymers and etching procedures are commonly employed
to develop the surface relief structures.[30,32−34] For instance, Netti et al.[35] reported an effective and inexpensive technique to fabricate switchable
holographic patterns in a light-sensitive azobenzene-based polymer
which is used to guide cell adhesion and orientation.Normally,
highly oriented polyethylene is produced by uniaxial
stretching in the solid state, i.e., at temperatures close to but
below the melting temperature.[36,37] The solid state stretching
procedure leads to a high degree of molecular orientation and chain
extension in polyethylene in the deformation direction, and hence
enhances its mechanical properties including Young’s modulus
and tensile strength.[38,39] Uniaxially oriented polyethylenes
are now used in load-bearing applications such as cranes and elevator
ropes,[40] and detecting strain in these
ropes upon tensile deformation is important with respect to predicting
their mechanical failure. In the present study, a facile and straightforward
method is developed to monitor strain in uniaxially oriented polyethylene
films upon tensile deformation based on surface relief patterns. The
approach to developing surface micropatterns consists of exposing
the film to an interference pattern using a pulsed laser with a wavelength
of 355 nm. To form the micropatterns, an appropriate amount of 2-(2H-benzotriazol-2-yl)-4,6-di-tert-pentylphenol
(BZT) is incorporated into polyethylene as a photoabsorber prior to
solid state stretching. Surface micropatterns with well-controlled
relief heights and grating pitches are successfully obtained on the
surface of the oriented polyethylene film without employing etching
procedures. The underlying mechanism for the generation of the micropatterns
is further investigated, and the feasibility of monitoring small strains
in the patterned, oriented polyethylene film during tensile deformation
is discussed.
Experimental Section
Materials
High density polyethylene was obtained from
Borealis (Burghausen, Germany) with number- and weight-average molecular
weights of 37 and 134 kg/mol, respectively. 2-(2H-Benzotriazol-2-yl)-4,6-di-tert-pentylphenol (BZT)
was purchased from BASF (Germany). Silicon oil was purchased from
Thermo Fisher Scientific Inc. (The Netherlands). All reagents were
used directly as received without further purification. ZAP-IT photosensitive
paper was obtained from Edmund Optics Inc. (USA).
Preparation
of Specimens
Uniaxially oriented polyethylene
films containing 2 and 5 wt % BZT were produced according to a procedure
described previously.[41] The 2 wt % BZT
and 5 wt % BZT were mixed with polyethylene in a corotating twin screw
extruder at 160 °C for 10 min. Subsequently, polyethylene sheets
containing BZT with a thickness of 0.3 mm were produced by compression
molding at 160 °C for 5 min, followed by cooling to room temperature
in a water-cooled press. The compression-molded sheets were subsequently
solid state stretched 10 times at 80 °C in air using a Zwick
Z100 tensile tester at a crosshead speed of 100 mm/min. Uniaxially
oriented polyethylene films with a thickness of approximately 100
μm were obtained. The draw ratio (λ) was determined from
the displacement of ink marks inscribed on the sheets prior to stretching
at an interval of 2 mm.Micropatterning of uniaxially oriented
polyethylene (PE) films was performed using a pulsed Nd:YAG laser
coupled to second and third harmonic modules emitting 4 ns pulses
at a repetition rate of 10 Hz and a wavelength of 355 nm. Linear polarized
light with a vertical polarization direction was used, and a schematic
diagram of the experimental setup is shown in Figure S1. In most cases, the film orientation direction is
horizontal, which is perpendicular to the grating direction. The energy
dose is tuned by rotating a half-wave plate in combination with a
beam splitter which determines the intensity of the laser.The
recording angles (2θ) between two interference beams
were 5.2, 2.0, 1.2, and 0.8°, which correspond to grating pitches
of approximately 4, 10, 16, and 26 μm, respectively. The interference
patterns have a diameter of 8 mm and the intensity is rather nonuniform,
as shown using an exposed photosensitive paper in Figure S2. In this particular case, the photosensitive paper
was exposed to an interference pattern with an energy dose of 120
mJ/cm2. The energy dose was measured using a Thorlabs PM100D
power meter (Germany) at the film position in Figure S1.The influence of the angle (α) between
the grating direction
and the film orientation direction on the height of the relief gratings
was investigated by rotating the film with respect to the grating
direction in a range between 0 and 90°. In this case, the oriented
PE film with 5 wt % BZT was exposed to an interference pattern with
a period of approximately 10 μm at a constant energy dose of
120 mJ/cm2.For reference, a direct laser writing
procedure was also performed
using the same pulsed Nd:YAG laser, as shown in Figure S3. For direct laser writing, the oriented film was
mounted on an x–y translation
stage and the film orientation direction was always horizontal, i.e.,
parallel to the x-axis of the translation stage.
The film was exposed to a single and focused beam with an energy dose
of 120 mJ/cm2 per pulse, and the film moved along the x-axis at a constant speed of 1 mm/s. A straight line with
a width of 0.6 mm was generated along the film orientation direction.
Prior to exposure, whether to an interference pattern or a direct
laser writing procedure, the oriented PE films were always placed
between glass slides and silicon oil was used to reduce the surface
light scattering which results from the fibrillar structure of the
solid state drawn films.[41] The reflections
between the glass, the silicon oil, and oriented polyethylene are
weak below 1% according to the Fresnel equations and Snell’s
law, and they are therefore ignored in this study. After recording
of the patterns, the oil on the film surface was removed by rinsing
with isopropyl alcohol.
Strain Sensors
An oriented polyethylene
film with relief
gratings with a pitch of 8.5 μm was mounted between clamps in
a Zwick Z100 tensile tester, as shown in Figure S4. A 10 mW He–Ne laser with a wavelength of 632.8 nm
and a beam diameter of 0.65 mm was used for generating a diffraction
pattern. The laser was aligned with the propagation direction of light
perpendicular to the film surface, and the light polarization direction
was parallel to the film orientation direction. The diffraction pattern
was projected on a screen with a millimeter grid, and a film-to-screen
distance (d) of 22 cm was used. Subsequently, strain
was imposed on the films at 1% intervals, between 0 and 10% along
the film orientation direction. The change in the position of the
first diffraction order was measured using the grid paper. In all
cases, at least three specimens were investigated and the average
displacement of the first diffraction order and the standard deviation
were calculated. Repeated testing of the strain sensors was carried
out at room temperature. The patterned oriented film with a grating
pitch of 8.5 μm was repeatedly loaded and unloaded to a strain
of 6%, and the distance between two first diffraction orders was measured.
In this case, 10 cycles were used. To investigate the temperature
influence of the strain sensors, similar testing procedures were used,
except that the measurements were performed in a Zwick Z100 tensile
tester equipped with a temperature-controllable oven. The oriented
polyethylene films were deformed at strains of 6 and 8% and at a temperature
between 20 and 60 °C.
Characterization
The surface morphology
of the oriented
polyethylene films with a thin gold layer was analyzed using a JSM-IT100
scanning electron microscope (SEM) (Japan) operating in a high vacuum
mode and at an accelerating voltage of 10 kV. Optical microscopy images
were obtained using a Leica CTR 6000 microscope. Differential scanning
calorimetry (DSC) was performed at a constant heating and cooling
rate of 10 °C/min under nitrogen flow using a DSC Q1000 instrument.
Thermogravimetric analyses (TGA) were performed in a TA Q500 instrument
at a constant heating rate of 10 °C/min and at a constant air
flow rate of 50 mL/min. Small-angle light scattering (SALS) was carried
out according to a procedure reported previously.[42] The film was located between two crossed polarizers with
the film orientation direction parallel to the analyzer (Hv). The
height of the relief gratings was measured using a DektakXT surface
profiler with a tip diameter of 2 μm and a force of 3 mg. At
least five different positions were measured to estimate the average
relief height on the film surface. Atomic force microscopy (AFM) measurements
were performed using a Solver P47H scanning probe microscope equipped
with a SMENA-B detecting head (NT-MDT Ltd., Moscow, Russia) in a tapping
mode and at a frequency of 320 kHz. Aluminum coated NCHV-A tips (Bruker)
with a tip length of 4 μm were used. Postprocessing of the raw
AFM data was performed using Gwyddion[43] and ImageJ, and the average and median height profiles of relief
gratings on the film surface were obtained perpendicular to the grating
direction.
Results
Previously, it was found
that the BZT molecules in the uniaxially
oriented polyethylene (PE) film are nondichroic and they are not incorporated
in the orthorhombic unit cell of polyethylene.[41] In other words, the BZT molecules are mainly concentrated
in the noncrystalline regions between the microfibrils of the oriented
PE.[41,44] More importantly, it was found that transparent,
oriented PE films are produced by introducing the BZT molecules into
PE prior to solid state stretching. The transparent appearance makes
it possible to monitor strains of these oriented PE films using a
laser beam in the transmission mode, which will be discussed later.The oriented PE films without and with 5 wt % BZT were exposed
to an interference pattern at an identical energy dose of 120 mJ/cm2. In the oriented PE film without BZT, only fibrillar structures
are observed (Figure A), which form during solid state drawing of the melt-crystallized
PE and there is no grating on the film surface. In sharp contrast,
in the oriented PE film containing 5 wt % BZT, periodic gratings with
a pitch of Λ0 = 9.5 ± 0.3 μm are successfully
generated with the grating direction perpendicular to the film orientation
direction (Figure B). The fibrillar structures in the unexposed regions are again observed,
and this is in contrast to the exposed regions which exhibit nonfibrillar
structures.
Figure 1
SEM images of oriented PE films (A) without and (B) with 5 wt %
BZT after illumination with an interference pattern at an energy dose
of 120 mJ/cm2. The arrows indicate the film orientation
direction, and the scale bar is 25 μm. (C) AFM 3-D image of
the oriented PE film containing 5 wt % BZT after illumination with
an interference pattern (Λ0 = 9.5 μm) at an
energy dose of 120 mJ/cm2 and (D) the relief height profile
along the red dashed line in image C.
SEM images of oriented PE films (A) without and (B) with 5 wt %
BZT after illumination with an interference pattern at an energy dose
of 120 mJ/cm2. The arrows indicate the film orientation
direction, and the scale bar is 25 μm. (C) AFM 3-D image of
the oriented PE film containing 5 wt % BZT after illumination with
an interference pattern (Λ0 = 9.5 μm) at an
energy dose of 120 mJ/cm2 and (D) the relief height profile
along the red dashed line in image C.The three-dimensional (3-D) AFM image in Figure C also indicates that the microfibrils
completely
disappear in the exposed regions. The unexposed regions are higher
than the exposed regions, which indicates that a height reduction
has taken place in the exposed regions. The relief grating possesses
a height of 0.6 μm, as shown in Figure D.The influence of energy dose on
the height of the relief gratings
on the surface of oriented PE film was also explored at an identical
grating pitch (Λ0 = 9.5 μm) with the grating
direction perpendicular to the film orientation direction. The results
in Figure illustrate
that a linear relationship exists between the relief height and the
energy dose above a certain threshold. The relief height linearly
increases to approximately 1 μm as the energy dose increases
to 160 mJ/cm2 for the oriented PE film with 5 wt % BZT.
At energy doses higher than 160 mJ/cm2, it was observed
that the exposed region becomes slightly brown, which indicates the
onset of degradation of the oriented polyethylene. A similar linear
relationship between the relief height and the energy dose above a
threshold is also observed for the oriented PE film with 2 wt % BZT
(Figure ). The slope
of the dose–response curve is, however, reduced quite significantly
and the threshold below which relief gratings are not observed is
higher.
Figure 2
Height of relief gratings (Λ0 = 9.5 μm)
as a function of energy dose for oriented PE containing various BZT
contents (measured by Dektak). The lines are used as a visual guide.
Height of relief gratings (Λ0 = 9.5 μm)
as a function of energy dose for oriented PE containing various BZT
contents (measured by Dektak). The lines are used as a visual guide.The pitch of relief gratings was
varied by changing the angle between
the interfering laser beams (see the Experimental
Section), and pitches of 4.5 ± 0.2, 9.5 ± 0.3, 16.3
± 0.8, and 26.4 ± 0.5 μm are successfully obtained
(Figure S5).Additionally, the angle
(α) between the film orientation
direction and the grating direction was adjusted by rotating the film
between 0 and 90° (see the Experimental Section). As shown in Figure , relief gratings are successfully generated on the film surface
at all angles (see also Figure S6 for AFM
images).
Figure 3
(A–F) SEM images of oriented PE films containing 5 wt %
BZT after illumination with an interference pattern (Λ0 = 9.5 μm) at an energy dose of 120 mJ/cm2 and at
various angles (α) between the grating direction and the film
orientation direction. Arrows indicate the film orientation direction.
Scale bar: 10 μm.
(A–F) SEM images of oriented PE films containing 5 wt %
BZT after illumination with an interference pattern (Λ0 = 9.5 μm) at an energy dose of 120 mJ/cm2 and at
various angles (α) between the grating direction and the film
orientation direction. Arrows indicate the film orientation direction.
Scale bar: 10 μm.AFM images in Figure indicate that the average relief height is highly dependent
on the
angle (α) between the grating and the orientation direction.
The height of the relief structures is averaged because microfibrils
in the unexposed regions create variations in relief height perpendicular
to the grating direction (Figure S7). Moreover,
the profiles in Figure S7 also indicate
that there is no obvious variation in the grating pitch. The exposed
regions are higher than the unexposed regions at α = 0°
(Figure A,C), and
this is in sharp contrast to the relief gratings at α = 90°
(Figure B,D).
Figure 4
AFM images
(50 μm × 50 μm) of oriented PE films
containing 5 wt % BZT after illumination with an interference pattern
(Λ0 = 9.5 μm) at an energy dose of 120 mJ/cm2 and at various angles (α) between the grating direction
and the film orientation direction: (A) α = 0° and (B)
α = 90°. (C) and (D) show the corresponding average height
profiles in the marked regions of (A) and (B) (see the Experimental Section). Arrows indicate the film orientation
direction.
AFM images
(50 μm × 50 μm) of oriented PE films
containing 5 wt % BZT after illumination with an interference pattern
(Λ0 = 9.5 μm) at an energy dose of 120 mJ/cm2 and at various angles (α) between the grating direction
and the film orientation direction: (A) α = 0° and (B)
α = 90°. (C) and (D) show the corresponding average height
profiles in the marked regions of (A) and (B) (see the Experimental Section). Arrows indicate the film orientation
direction.In Figure , the
average height of the relief gratings using both AFM and a Dektak
surface profiler (see the Experimental Section) is plotted as a function of the angle (α) between the grating
direction and the film orientation direction. The results show an
excellent agreement in the measurements of the average relief height
between AFM and the Dektak surface profiler. It is found that at an
angle (α) between 30 and 90°, the exposed regions are lower
than the unexposed regions. The average relief height by the Dektak
surface profiler decreases from 0.63 ± 0.12 to 0.38 ± 0.08
μm as the angle (α) changes from 90 to 30°. The exposed
regions become higher than the unexposed regions at α equal
to or below 20°. The benzotriazole (BZT)-based UV absorber is
well-known for its photochemical properties.[45−48] By illumination with UV light
in the absorption band at 355 nm, the non-hydrogen-bonding [N] state
of BZT absorbs photo energy. Subsequently, the transoid [N]* state
is converted into the cisoid, hydrogen-bonding [H] state via isomerization.
Alternatively, the [N]* state may proceed to the [N] ground state
by transferring energy to the [H] ground state, which then dissipates
the photoexcitation energy as heat by a proton transfer mechanism.
The thermal energy results in a temperature increase in the exposed
region. To demonstrate this hypothesis, the oriented PE film containing
5 wt % BZT was directly exposed to a single and focused laser beam
at an energy dose of 120 mJ/cm2 per pulse. The film was
mounted on an x–y stage (see
the Experimental Section). A line with a width
of 0.6 mm along the film orientation direction was generated using
a direct laser writing procedure, as shown in Figure S8A,B.
Figure 5
Height of relief gratings as a function of the angle (α)
between the grating direction and the film orientation direction of
oriented PE films containing 5 wt % BZT after illumination with an
interference pattern (Λ0 = 9.5 μm) at an energy
dose of 120 mJ/cm2. Solid symbols, data from Dektak surface
profiler; empty symbols, data from AFM.
Height of relief gratings as a function of the angle (α)
between the grating direction and the film orientation direction of
oriented PE films containing 5 wt % BZT after illumination with an
interference pattern (Λ0 = 9.5 μm) at an energy
dose of 120 mJ/cm2. Solid symbols, data from Dektak surface
profiler; empty symbols, data from AFM.The microscopy image under crossed polarizers in Figure S8B indicates that isotropic crystalline
structures
form in the written region. The result is verified using small-angle
light scattering (SALS) in the so-called Hv mode where a four-lobe
cloverleaf pattern indicates the formation of spherulitic structures
in the written region (Figure S8C). It
is therefore concluded that the absorption of UV light results in
a temperature increase in the written region which leads to local
melting of the oriented PE and subsequently recrystallization upon
cooling at room temperature. In other words, the temperature in the
written region at least rises higher than the melting point of the
oriented PE (Tm = 140 °C) (Figure S9). It seems reasonable to assume that
local melting also occurs during interference holography at an identical
energy dose. For the patterned PE film at α = 90°, AFM
images and the corresponding height profiles in Figure S10 indicate that the height variation in the exposed
regions along the grating direction from the microfibrils becomes
less apparent, which is attributed to the melting and subsequently
recrystallization upon illumination.Generally, upon exposure
to an interference pattern, the BZT induces
a UV light intensity gradient in the cross section of the oriented
PE films. The relative light intensity of the UV light at the position z (μm) in the thickness direction is expressed by
the equation based on Lambert–Beer’s law:where
μ is the absorption coefficient
(for BZT, μ ≈ 0.01 (wt %)−1 μm–1), c is the BZT concentration (wt
%), Io is the initial intensity of the
incident laser, and I( is the intensity at the position (z) in the film
thickness direction. In Figure S11, it
is shown that the UV light is almost completely absorbed in the top
layer at the positions of z = 30 μm and z = 70 μm in the thickness direction of the oriented
PE film containing 5 and 2 wt % BZT, respectively. For the oriented
PE film containing 5 wt % BZT upon exposure to an interference pattern
with a high energy dose of 160 mJ/cm2, an average height
of approximately 1 μm of the relief gratings was observed (Figure ) which corresponds
to ∼3% of height decrease in the exposed region based on the
depth of the UV light in the film (z = 30 μm)
(Figure S11). Therefore, a volume decrease
of less than 3% is estimated in the exposed region. This volume decrease
might be partially attributed to the thermal evaporation of BZT at
a high temperature. In Figure S12, the
onset of weight loss of BZT is observed at a temperature of 140 °C
and 95 wt % of BZT evaporates at a temperature of 247 °C.In the present study, an oriented polyethylene film with a relief
grating (Λ1 = 8.5 μm) was used to measure strains
in the film upon tensile deformation. In Figure S13, a laser beam (λ = 632.8 nm) with its propagation
direction of light perpendicular to the film surface is used. In this
case, multiple diffraction orders are generated (Figure S14), which indicates that thin gratings are obtained
in the so-called Raman–Nath regime.For simplification,
only the zero (m0) and the first diffraction
orders (±m1 or ±m11) are shown in Figure S13. When a strain (ε) in the film
orientation direction is imposed (Figure S13), the initial grating period Λ1 increases to Λ11, where Λ11 is equal to (1 + ε)Λ1. The diffraction angle θof the first diffraction order (m11) after deformation is expressed bySimilarly,
the distance (a11) between the m0 and the m11 diffraction
orders after
deformation in Figure S13 is obtained byBased on eqs and 2, the displacement
(Δa = a1 – a11)
of the first diffraction order prior to and after deformation is predicted
at a given strain (ε)where a1 is the distance
between the m0 and the m1 diffraction orders prior
to deformation.An excellent agreement is observed between the
experimental data
and the theoretical predictions based on eqs –3 (Figure ). A displacement
of 1.48 ± 0.14 mm of the first diffraction order corresponds
to a strain of 10% of the patterned oriented PE film. The results
in Figure B demonstrate
an excellent reversibility of the strain sensors at a strain of 6%.
The temperature dependence of the relief structures with a grating
pitch of Λ1 = 8.5 μm was also investigated
at strains of 6 and 8% (Figure S15). The
results indicate that the temperature hardly influences the accuracy
of the sensors.
Figure 6
(A) Displacement (Δa = a1 – a11)
of the first
diffraction order as a function of strain (ε) and (B) multiple-cycle
tests with repeated loading–unloading at 6% strain. The patterned
oriented film possesses a grating pitch of Λ1 = 8.5
μm. The dashed line in (A) represents the theoretical calculation
based on eqs –3, and the dashed line in (B) is used as a visual
guide.
(A) Displacement (Δa = a1 – a11)
of the first
diffraction order as a function of strain (ε) and (B) multiple-cycle
tests with repeated loading–unloading at 6% strain. The patterned
oriented film possesses a grating pitch of Λ1 = 8.5
μm. The dashed line in (A) represents the theoretical calculation
based on eqs –3, and the dashed line in (B) is used as a visual
guide.
Discussion
A new procedure is reported
for generation of surface micropatterns
on uniaxially oriented polyethylene films using interference holography.
These micropatterns are rather inhomogeneously distributed across
the film surface. This inhomogeneity is attributed to an inhomogeneous
intensity distribution of the interference pattern which was generated
with a pulsed laser (Figure S2). More importantly,
it is demonstrated that the BZT used in this study functions like
a linear photoresist; i.e., the height of the relief gratings increases
linearly with increasing energy dose (Figure ) above a certain threshold, which consequently
results in an inhomogeneity in the height of the relief gratings on
the film surface. The inhomogeneity issue was circumvented by measuring
the most intense regions in Figure S2,
and at least five regions were measured using the Dektak surface profiler
to reflect the actual height of relief gratings. The micropatterns
are probably generated based on a combination of local melting/recrystallization
of the uniaxially oriented polyethylene as well as thermal evaporation
of BZT in the exposed regions. Normally, melting the oriented polyethylene
leads to entropy-driven contraction which is expected to result in
a height increase while thermal evaporation of BZT is expected to
decrease the height of the relief structures in the exposed regions.
It is also well-established that uniaxially oriented polyethylenes
have a highly anisotropic thermal conductivity.[49,50] The anisotropy in thermal conductivity of the oriented high density
polyethylene at a λ = 10 is around 30 at room temperature.[37] It is anticipated that this anisotropic thermal
conductivity leads to a variation in the entropy-driven contraction
of the oriented polyethylene and thereby contributes to the angle-dependent
height of the relief structure.
Conclusions
In
this study, we report the generation of micropatterns on the
surface of uniaxially oriented PE film using interference holography.
The method is based on a BZT-induced transition from photo energy
to heat by illumination with an interference pattern. This process
leads to local melting and entropy-driven contraction of the oriented
PE, and thermal evaporation of the BZT in the exposed regions, which
is accompanied by a height change and formation of the micropatterns
and this without using etching procedures. In the case of the energy
dose above the threshold, the actual height of the relief gratings
on the film surface is dependent on not only the initial BZT concentration
in the film and the energy dose used, but also the angle between the
film orientation direction and the grating direction. It is also shown
that the micropatterned films can be used as strain sensors with a
comparatively high accuracy. The strain sensors are reversible and
rather insensitive to temperature.
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