Literature DB >> 29189013

Deterministic Line-Shape Programming of Silicon Nanowires for Extremely Stretchable Springs and Electronics.

Zhaoguo Xue1, Mei Sun2, Taige Dong1, Zhiqiang Tang2, Yaolong Zhao1, Junzhuan Wang1, Xianlong Wei2, Linwei Yu1,3, Qing Chen2, Jun Xu1, Yi Shi1, Kunji Chen1, Pere Roca I Cabarrocas3.   

Abstract

Line-shape engineering is a key strategy to endow extra stretchability to 1D silicon nanowires (SiNWs) grown with self-assembly processes. We here demonstrate a deterministic line-shape programming of in-plane SiNWs into extremely stretchable springs or arbitrary 2D patterns with the aid of indium droplets that absorb amorphous Si precursor thin film to produce ultralong c-Si NWs along programmed step edges. A reliable and faithful single run growth of c-SiNWs over turning tracks with different local curvatures has been established, while high resolution transmission electron microscopy analysis reveals a high quality monolike crystallinity in the line-shaped engineered SiNW springs. Excitingly, in situ scanning electron microscopy stretching and current-voltage characterizations also demonstrate a superelastic and robust electric transport carried by the SiNW springs even under large stretching of more than 200%. We suggest that this highly reliable line-shape programming approach holds a strong promise to extend the mature c-Si technology into the development of a new generation of high performance biofriendly and stretchable electronics.

Entities:  

Keywords:  In-plane silicon nanowires; line-shape engineering; stretchable electronics

Year:  2017        PMID: 29189013     DOI: 10.1021/acs.nanolett.7b03658

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  1 in total

1.  Measurement of Linear Springs' Stiffness Factor Using Ultrasonic Sensing.

Authors:  Zhongwei Zhang; Xiyan Zhang; Bohui Ma; Mengyao Ding; Bowen Zhu; Dezheng Tong
Journal:  Sensors (Basel)       Date:  2022-08-05       Impact factor: 3.847

  1 in total

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