| Literature DB >> 29185344 |
Tae Ho Lee1, Byeong Ryong Lee1, Kyung Rock Son1, Hee Woong Shin1,2, Tae Geun Kim1.
Abstract
Many studies have set out to develop electrodes that are both highly conductive and transparent across a wide spectral region, from visible to deep UV (DUV). However, few solutions have been proposed because these two properties are mutually exclusive. In this paper, an AlN-based glass electrode film with a conducting filament formed by the application of an ac pulse is proposed as a solution, which exhibits a high transmittance in the DUV region (over 95.6% at 280 nm) and a low contact resistance with a p-Al0.4Ga0.6N layer (ρc = 3.2 × 10-2 Ω·cm2). The Ohmic conduction mechanism at the interface between the AlN film and the p-Al0.4Ga0.6N layers is fully examined using various analytical tools. This AlN film is finally applied to a 280 nm top-emitting light-emitting diode, to verify the validity of the method, which exhibits very stable operations with a forward voltage of 7.7 V at 20 mA, a light output power of 7.49 mW at 100 mA, and, most importantly, a record high external quantum efficiency of 2.8% after packaging.Entities:
Keywords: deep-UV light-emitting diode; direct Ohmic contact; glass electrode; pulsed electrical breakdown; transparent conductive electrode
Year: 2017 PMID: 29185344 DOI: 10.1021/acsami.7b13624
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229