| Literature DB >> 29142690 |
Wei Hong1, Shaoyun Chen1,2,3, Bin Sun1, Mark A Arnould4, Yuezhong Meng2, Yuning Li1.
Abstract
This study utilized high temperature NMR and matrix-assisted laser desorpn>tion/ionization time-of-flight (MALDI-ToF) mass spectrometry to reveal that apn>preciable amounts of structural defects are present in the diketopyrrolopyrrole (DPP)-quaterthiophene copolymers (PDQT) synthesized by the Stille coupling polymerization with Pd(PPh3)2Cl2, Pd2(dba)3/P(o-tol)3, and Pd(PPh3)4 catalyst systems. It was proposed that these structural defects were produced via homocoupling side reactions of the C-Br bonds and the organostannane species. Model Stille coupling reactions further substantiated that the amount of structural defects are catalyst-dependent following the order of Pd(PPh3)2Cl2 > Pd2(dba)3/P(o-tol)3 > Pd(PPh3)4. To verify the structural assignments, "perfect" structurally regular PDQT polymers were prepared using Yamamoto coupling polymerization. When compared to the structurally regular polymers, the polymers containing defects exhibited notable redshifts in their absorption spectra. Surprisingly, the "perfect" structurally regular polymers showed poor molecular ordering in thin films and very low charge transport performance as channel semiconductors in organic thin film transistors (OTFTs). On the contrary, all the "defected" polymers exhibited much improved molecular ordering and significantly higher charge carrier mobility.Entities:
Year: 2015 PMID: 29142690 PMCID: PMC5657407 DOI: 10.1039/c5sc00843c
Source DB: PubMed Journal: Chem Sci ISSN: 2041-6520 Impact factor: 9.825
Scheme 1Synthetic routes to PDQT polymers P1–P4: (i) Pd(PPh3)2Cl2/toluene/reflux; (ii) Pd2(dba)3/P(o-tol)3 (molar ratio: 1/4)/chlorobenzene/130 °C; (iii) Pd(PPh3)4/toluene/reflux; (iv) Ni(COD)2/2,2′-bipyridyl/THF/60 °C.
Summary of molecular weights and properties of polymers P1–P4
| Polymer | Catalyst | HT-GPC | MALDI-ToF |
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| PDI | DBT : BT ratio | Sol. | Film | ||||
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| Pd(PPh3)2Cl2 | 21.4 | 2.03 | 1 : 0.67–1.33 ( | 775 | 783 | 1.24 | –5.3/–4.1 |
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| Pd2(dba)3/P( | 47.0 | 2.90 | 1 : 0.43–1.14 ( | 787 | 786 | 1.34 | –5.3/–4.0 |
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| Pd2(dba)3/P( | 54.9 | 3.12 | NA | 781 | 781 | 1.32 | –5.3/–4.0 |
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| Pd(PPh3)4 | 38.3 | 2.16 | 1 : 0.80–1.3 ( | 798 | 787 | 1.38 | –5.3/–4.0 |
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| Ni(COD)2/2,2′-bipyridyl | — | — | 1 : 1 | 773 | 783 | 1.46 | –5.3/–3.9 |
|
| Ni(COD)2/2,2′-bipyridyl | 23.8 | 2.51 | 1 : 1 | 785 | 790 | 1.43 | –5.3/–3.9 |
HT-GPC, UV-Vis, and cyclic voltammetry data for P2a and P2b were reported previously.[34,35]
DBT: 3,6-di([2,2′-bithiophen]-5-yl)-2,5-bis(2-octyldodecyl)pyrrolo[3,4-c]pyrrole-1,4(2H,5H)-dione or 3,6-di([2,2′-bithiophen]-5-yl)-2,5-bis(2-tetradecyldecyl)pyrrolo[3,4-c]pyrrole-1,4(2H,5H)-dione, BT: 2,2′-bithiophen-diyl.
n: the number of DBT units.
The fraction extracted with TCE.
The fraction extracted with chloroform.
Fig. 1UV-Vis absorption spectra of P1–P4 in solution (TCE) and in thin films.
Fig. 2500 MHz 1H NMR spectra of P1–P4 acquired in deuterated 1,1,2,2-tetrachloroethane (TCE-d2) at 125 °C.
Fig. 3MALDI-ToF mass spectra of polymers from selected times in the chromatograms, where the vertical dashed lines represent the theoretical molecular masses of polymers with the regular structure –(DBT–BT)– at different numbers of repeat units (n) without contribution of the terminal groups.
Scheme 2(a) Model Stille coupling reactions using different catalyst systems: (i) Pd(PPh3)2Cl2/toluene/reflux; (ii) Pd2(dba)3/P(o-tol)3 (molar ratio: 1/4)/chlorobenzene/130 °C; (iii) Pd(PPh3)4/toluene/reflux. (b) Proposed formation of structural defects DBT–DBT and BT–BT via the homocoupling side reactions.
Fig. 4Reflective XRD diagrams of P1–P4 thin films (with similar thicknesses of ∼50 nm) spin coated on dodecyltrichlorosilane-modified SiO2/Si wafer and annealed at 150 °C or 200 °C using Cu Kα1 radiation (λ = 0.15406 nm). Note that the intensity scale for P4a is one-tenth of that in other diagrams due to the low diffraction intensities of this polymer. Data for P2a and P2b were reported previously.[35]
Fig. 5Transmission XRD diagrams of P1–P4 flakes (thicknesses were not intentionally controlled) annealed at 200 °C using Mo Kα radiation (λ = 0.071073 nm). Data for P2a and P2b were reported previously.[35]
Summary of XRD results and OTFT performance of polymers P1–P4
| Polymer | Anneal. temp. (°C) | XRD | OTFT performance | |||
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| Ave. (max) |
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| 150 | 1.91 | 1.60 (2.10) | ∼106 | –6 | |
| 200 | 1.92 | 0.38 | 2.84 (2.94) | ∼104 | –3 | |
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| 150 | 1.91 | 1.58 (2.10) | ∼104 | –10 | |
| 200 | 1.88 | 0.38 | 3.57 (5.50) | ∼106 | –7 | |
|
| 150 | 2.13 | 2.65 (3.37) | ∼104 | 18 | |
| 200 | 2.11 | 0.39 | 1.46 (1.51) | ∼104 | 18 | |
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| 150 | 1.91 | 1.62 (1.74) | ∼104 | 17 | |
| 200 | 1.89 | 0.38 | 1.35 (1.41) | ∼104 | 19 | |
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| 150 | 1.98 | 0.065 (0.084) | ∼108 | –22 | |
| 200 | 1.98 | 0.38 | 0.029 (0.036) | ∼105 | –35 | |
|
| 150 | 2.15 | 0.90 (0.94) | ∼106 | –8 | |
| 200 | 2.13 | 0.39 | 1.10 (1.13) | ∼106 | –24 | |
Data for P2a and P2b were reported previously.[34,35]
Fig. 6AFM height images (2 µm × 2 µm each) of P1–P4 thin films (∼50 nm) spin-coated on dodecyltrichlorosilane-modified Si/SiO2 wafers and annealed at 150 °C or 200 °C. Images of P2b were reported previously.[35]
Fig. 7Output (top) and transfer (bottom) characteristics of typical bottom-gate bottom-contact OTFT devices using polymers P1–P4 as channel semiconductors. The polymer thin films were annealed at 150 °C for 15 min. Device dimensions: L = 30 µm; W = 1 mm. N-doped Si/SiO2 wafers were used as substrates. The thickness of the dielectric SiO2 layer is 200 nm for P1 and P2a and 300 nm for the other polymers. Curves for P2a and P2b were reported previously.[35]