| Literature DB >> 29118451 |
T Sant1, D Ksenzov1, F Capotondi2, E Pedersoli2, M Manfredda2, M Kiskinova2, H Zabel3, M Kläui3, J Lüning4, U Pietsch1, C Gutt5.
Abstract
Exciting a ferromagnetic material with an ultrashort IR laser pulse is known to induce spin dynamics by heating the spin system and by ultrafast spin diffusion processes. Here, we report on measurements of spin-profiles and spin diffusion properties in the vicinity of domain walls in the interface region between a metallic Al layer and a ferromagnetic Co/Pd thin film upon IR excitation. We followed the ultrafast temporal evolution by means of an ultrafast resonant magnetic scattering experiment in surface scattering geometry, which enables us to exploit the evolution of the domain network within a 1/e distance of 3 nm to 5 nm from the Al/FM film interface. We observe a magnetization-reversal close to the domain wall boundaries that becomes more pronounced closer to the Al/FM film interface. This magnetization-reversal is driven by the different transport properties of majority and minority carriers through a magnetically disordered domain network. Its finite lateral extension has allowed us to measure the ultrafast spin-diffusion coefficients and ultrafast spin velocities for majority and minority carriers upon IR excitation.Entities:
Year: 2017 PMID: 29118451 PMCID: PMC5678147 DOI: 10.1038/s41598-017-15234-7
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Experimental pump-probe setup in reflection geometry, demagnetization and structure factor. (a) XUV pulses incident at fixed angles α i probe the magnetic multilayer sample in penetration depths ranging from 2.8 to 5.4 nm. The IR pump pulse arrives with a small offset (<2°) w.r.t. the FEL beam on the sample. The CCD measures the resonant magnetic scattering signal where the intense specularly reflected beam is blocked by the beamstop and the IR radiation is absorbed by an IR filter (not shown) in front of the CCD. α f and 2θ are the out-of-plane and in-plane scattering angles, respectively. (b) The time evolution of the normalized magnetization (measured as the area under the scattering peak). The lines are fits to the data points following Ref.[7]. (c) Upper panel: The scattering structure factor (normalized to its maximum) for an unpumped (blue, = −1.5 ps) and for a pumped film (red, = 0.5 ps) at = 3.6 nm. The lower panel shows the corresponding distortion function .
Figure 2Measured and calculated distortion functions and spin difference profiles. The left panels display the distortion functions from the measured azimuthally structure factors (filled symbols) and the corresponding calculated distortion functions (solid lines) following the model described in the SI for the XUV penetration depths. The distortion functions for different delays for each penetration depth are vertically shifted for clarity. The right panels show the majority spin profile (), minority spin profile () and the spin difference profile () for a pump-probe delay of = 0.5 ps. The spin up domain (Co↑) exists for 0 and the spin down domain (Co↓) for 0 with the domain boundary at = 0.
Figure 3Diffusion coefficients and ratio of velocities for majority and minority spin carriers. (a) Diffusion coefficients at selected pump-probe delays for majority and minority spin carriers estimated from the widths of the respective profiles ( and ) across a domain wall. (b) Ratio of the velocities of majority and minority spin carriers at selected pump-probe delays. Solid lines are guide to the eyes.