| Literature DB >> 29113129 |
Choon-Sang Park1, Eun Young Jung2, Dong Ha Kim3, Do Yeob Kim4, Hyung-Kun Lee5, Bhum Jae Shin6, Dong Ho Lee7, Heung-Sik Tae8.
Abstract
Although polymerizedEntities:
Keywords: X-ray Diffraction (XRD); X-ray photoelectron spectroscopy (XPS); atmospheric pressure plasma; iodine doping; nanofiber; plasma polymerization; polymerized aniline (PANI); time of flight secondary ion mass spectrometry (ToF-SIMS)
Year: 2017 PMID: 29113129 PMCID: PMC5706219 DOI: 10.3390/ma10111272
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1(Left) Schematic diagram of experimental set-up with plasma image produced in nucleation region of intense and broad plasma; and (Right) comparison of cross-sectional area of plasma, where A denotes restricted plasma area of three array jets and B denotes larger plasma area of intense and broad plasma region when using proposed advanced atmospheric pressure plasma (APP) polymerization system.
Figure 2Plane (left and middle); and cross-sectional (right) scanning electron microscopy (SEM) images of polymerized aniline (PANI) films grown on glass substrates when using advanced APP jets (APPJs) device after 30 min deposition without iodine (I2), with 30 s I2 doping, and with 120 s I2 doping following deposition.
Figure 3Three-dimensional (3D) atomic force microscope (AFM) images of roughness (Rrms) of PANI film surfaces grown on glass substrates and granularity cumulation distribution charts with average grain diameter obtained from AFM images when using advanced APPJs device after 30 min deposition without I2 doping, with 30 s I2 doping, and with 120 s I2 doping following deposition.
Figure 4X-ray diffraction (XRD) patterns of PANI film surfaces grown on Si substrates using advanced APPJs device after 60 min deposition without I2 doping and with 120 s I2 doping following deposition.
Figure 5Fourier transform infrared spectroscopy (FT-IR) spectra of PANI films grown on glass substrates using advanced APPJs device after 60 min deposition without I2 doping, with 30 s I2 doping, and with 120 s I2 doping following deposition.
Figure 6Differences in PANI film surfaces grown on glass substrates when using advanced APPJs device after 60 min deposition without I2 doping, with 30 s I2 doping, and with 120 s I2 doping following deposition: (a) X-ray photoelectron spectroscopy (XPS) survey spectra; and detailed (b) C 1s (high-resolution); (c) N 1s (high-resolution); (d) O 1s; and (e) I 3d spectra. Insets in (a) represent atom percent in PANI film.
Peak assignment (BE, eV) and envelope composition (%, total = 100) of various C 1s core level spectra of polymerized aniline (PANI) observed in X-ray photoelectron spectroscopy (XPS) spectra in Figure 6b.
| Sample | C 1s Peaks Assignment and Envelope Composition | |||||
|---|---|---|---|---|---|---|
| 284.0 | 285.6 | 286.5 | 288.1 | 289.4 | 291.1 | |
| PANI I2 no Doping | 16.84 | 11.54 | 26.00 | 26.79 | 14.73 | 4.10 |
| PANI I2 Doping 30 s | 19.25 | 12.77 | 20.48 | 27.27 | 13.80 | 6.43 |
| PANI I2 Doping 120 s | 22.47 | 10.86 | 19.48 | 22.46 | 17.97 | 6.76 |
Peak assignment (BE, eV) and envelope composition (%, total = 100) of various N 1s core level spectra of PANI observed in XPS spectra in Figure 6c.
| Sample | N 1s Peaks Assignment and Envelope Composition | ||
|---|---|---|---|
| 398.3 | 399.8 | 402.1 | |
| PANI I2 no Doping | 13.84 | 44.04 | 42.12 |
| PANI I2 Doping 30 s | 17.02 | 42.17 | 40.81 |
| PANI I2 Doping 120 s | 17.85 | 42.84 | 39.31 |
Figure 7Negative-ion time of flight secondary ion mass spectrometry (ToF-SIMS) spectra (0–200 amu) of PANI film surfaces grown on glass substrates when using advanced APPJs device after 60 min deposition: (a) without I2 doping; (b) with 30 s I2 doping; and (c) with 120 s I2 doping following deposition.
Selected peaks and their assignments observed in negative-ion time of flight secondary ion mass spectrometry (ToF-SIMS) spectra of PANI.
| Negative Ion Mass Spectrum | Possible Ion Fragment/Possible Structure |
|---|---|
| 12 | C- |
| 13 | CH− |
| 15 | NH− |
| 16 | O− |
| 17 | OH− |
| 24 | C2− |
| 25 | C2H− |
| 26 | CN− |
| 30 | CNO− |
| 32 | O2− |
| 36 | C3− |
| 37 | C3H− |
| 42 | CNO− |
| 48 | C4− |
| 49 | C4H− |
| 50 | C3N− |
| 127 | I− |
Figure 8Positive-ion ToF-SIMS narrow range spectra (0–100 amu) of PANI film surfaces grown on glass substrates using advanced APPJs device after 60 min deposition: (a) without I2 doping; (b) with 30 s I2 doping; and (c) with 120 s I2 doping following deposition.
Selected peaks and their assignments observed in positive-ion ToF-SIMS spectra of PANI.
| Positive Ion Mass Spectrum | Possible Ion Fragment/Possible Structure |
|---|---|
| 12 | C+ |
| 15 | CH3+ |
| 27 | C2H3+/CH2–CH+ |
| 29 | C2H5+/CH3–CH2+ |
| 39 | C3H3+/CH2–C–CH+ |
| 41 | C3H5+/CH2–CH–CH2+ |
| 43 | C3H7+/CH3–CH2–CH2+ |
| 51 | C4H3+/CH2–C–C–CH+ |
| 55 | C4H7+/CH2–CH–CH2–CH2+ |
| 57 | C4H9+ or C3H7N+ |
| 67 | C5H7+ |
| 69 | C5H9+ |
| 77 | C6H5+ |
| 81 | C6H9+ |
| 91 | C7H7+ |
| 93 | C7H9+ |
| 95 | C7H11+ |
Figure 9Comparison of normalized intensities of: (a) negative-ion ToF-SIMS; and (b) positive-ion ToF-SIMS on surface of PANI films when using advanced APPJs device without I2 doping, with 30 s I2 doping, and with 120 s I2 doping following deposition.
Figure 10Changes in resistance of PANI films grown on substrates of interdigitated electrodes when using advanced APPJs device after 60 min deposition with no I2 doping, with 30 s I2 doping, and with 120 s I2 doping following deposition.