| Literature DB >> 29110457 |
Fei Hui1,2, Wenjing Fang2, Wei Sun Leong2,3, Tewa Kpulun4, Haozhe Wang2, Hui Ying Yang3, Marco A Villena1,5, Gary Harris4, Jing Kong2, Mario Lanza1.
Abstract
Large-area hexagonal boron nitride (h-BN) can be grown on polycrystalline metallic substrates via chemical vapor deposition (CVD), but the impact of local inhomogeneities on the electrical properties of the h-BN and their effect in electronic devices is unknown. Conductive atomic force microscopy (CAFM) and probe station characterization show that the tunneling current across the h-BN stack fluctuates up to 3 orders of magnitude from one substrate (Pt) grain to another. Interestingly, the variability in the tunneling current across the h-BN within the same substrate grain is very low, which may enable the use of CVD-grown h-BN in ultra scaled technologies.Entities:
Keywords: chemical vapor deposition; conductive AFM; electrical homogeneity; hexagonal boron nitride; polycrystalline
Year: 2017 PMID: 29110457 DOI: 10.1021/acsami.7b09417
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229