| Literature DB >> 29046844 |
Patrícia M Amorim1,2, Ana M Ferraria3, Rogério Colaço4, Luís C Branco2, Benilde Saramago1.
Abstract
In recent years, with the development of micro/nanoelectromechanical systems (MEMS/NEMS), the demand for efficient luEntities:
Keywords: additives; ionic liquids; lubricants; nanotribology; silicon
Year: 2017 PMID: 29046844 PMCID: PMC5629412 DOI: 10.3762/bjnano.8.197
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.649
Figure 1Structure of the studied ILs.
Figure 2(a) AFM observation of the worn surface of Si submitted to nanotribological tests under dry conditions and (b) height profile of the worn region.
Viscosity, η, at 25 °C and water content of dry and humid liquids.
| PEG + IL additive | humid liquids | dry liquids | ||
| η/mPa·s | water content/ppm | η/mPa·s | water content/ppm | |
| PEG | 36 | 4466 | 40 | 200–500 |
| PEG + [EMIM][TfO] | 48 | 3932 | 53 | 568 |
| PEG + [BMIM][TfO] | 47 | 3970 | 52 | 674 |
| PEG + [BMIM][DCA] | 52 | 4061 | 56 | 552 |
Figure 3CoF as a function of the Sommerfeld parameter, Z, for (a) humid and (b) dry PEG (black circle) and PEG + [EMIM][TfO] (blue triangle), PEG + [BMIM][TfO] (red diamond), and PEG + [BMIM][DCA] (green square).
Figure 4Contact angles of (a) humid and (b) dry PEG + [BMIM][DCA] (1), PEG + [BMIM][TfO] (2), PEG + [EMIM][TfO] (3), and PEG (4) on silicon substrates. The error bars correspond to standard deviations (n ≥ 7).
Viscosity, η, at 25 °C, water content and contact angle of PEG + IL mixtures.
| PEG + IL additive | η/mPa·s | water content/ppm | contact angle/° |
| PEG + [EMIM][TfO] | 53 | 568 | 24 ± 2 |
| PEG + [BMIM][TfO] | 52 | 675 | 27 ± 2 |
| PEG + [C2OHMIM][TfO] | 55 | 466 | 15 ± 1 |
| PEG + [AMIM][TfO] | 40 | 406 | 17 ± 1 |
| PEG + [BMIM][DCA] | 56 | 552 | 22 ± 6 |
| PEG + [C2OHMIM][DCA] | 52 | 560 | 17 ± 2 |
| PEG + [EMIM][EtSO4] | 53 | 432 | 17 ± 2 |
| PEG + [EVIM][EtSO4] | 75 | 480 | 19 ± 3 |
Figure 5CoF vs Sommerfeld parameter, Z, for (a) TfO-based, (b) DCA-based and (c) EtSO4-based ILs mixed with PEG: PEG (black circles), PEG + [EMIM][TfO] (red squares), PEG + [BMIM][TfO] (blue squares), PEG + [C2OHMIM][TfO] (green squares), PEG + [AMIM][TfO] (purple squares), PEG + [BMIM][DCA] (blue triangles), PEG + [C2OHMIM][DCA] (green triangles), PEG + [EMIM][EtSO4] (red diamonds), PEG + [EVIM][EtSO4] (yellow diamonds).
Figure 6AFM images and height profiles of the sliding tracks in (a) dry PEG, (b) PEG + [EMIM][TfO] and (c) PEG + [EMIM][EtSO4].
Figure 7XPS regions of (a) C 1s, (b) S 2s, and (c) N 1s for, from bottom to top, in (a) Si/PEG, Si/PEG + [EMIM][EtSO4] and Si/PEG + [EMIM][TfO], and in (b) and (c) Si/PEG + [EMIM][EtSO4] and Si/PEG+[EMIM][TfO]. The solid black line in (b) represents the smoothed data.
XPS atomic ratios for the Si samples coated with PEG, PEG + [EMIM][EtSO4] and PEG + [EMIM][TfO].
| PEG + [EMIM][EtSO4] | PEG + [EMIM][TfO] | PEG | |
| C–O/Si | 0.41 ± 0.01 | 0.43 ± 0.01 | 0.46 ± 0.01 |
| N/C–O | 0.13 ± 0.01 | 0.16 ± 0.01 | — |
| S/C–O | 0.042 ± 0.004 | 0.066 ± 0.007 | — |