| Literature DB >> 28993642 |
Toshio Miyamachi1, Shigemasa Suga2,3, Martin Ellguth4, Christian Tusche3,5, Claus M Schneider3,5, Fumitoshi Iga6, Fumio Komori7.
Abstract
Structural and electronic properties of the SmB6(001) single-crystal surface prepared by Ar+ ion sputtering and controlled annealing are investigated by scanning tunneling microscopy. In contrast to the cases of cleaved surfaces, we observe a single phase surface with a non-reconstructed p(1 × 1) lattice on the entire surface at an optimized annealing temperature. The surface is identified as Sm-terminated on the basis of spectroscopic measurements. On a structurally uniform surface, the emergence of the in-gap state, a robust surface state against structural variation, is further confirmed inside a Kondo hybridization gap at 4.4 K by temperature and atomically-resolved spatial dependences of the differential conductance spectrum near the Fermi energy.Entities:
Year: 2017 PMID: 28993642 PMCID: PMC5634509 DOI: 10.1038/s41598-017-12887-2
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Schematic crystal structure of SmB6. (b) Photographs of the SmB6(001) single crystal and its mounting. (c) STM image of the SmB6(001) surface annealed at 1030 °C. (d) STM height profile of atomic steps along the blue line in (c). The interval between the grid lines in height is nearly equal to the lattice constant of SmB6.
Figure 2(a) STM images of the SmB6(001) surface annealed at 900, 980 and 1030 °C. (b) f values as a function of the annealing temperature with the least squares fit. (c) Typical STM height profiles of the SmB6(001) surface annealed at 900 and 1030 °C. The interval between the grid lines in height is nearly equal to the lattice constant of SmB6.
Figure 3Large scale STM images of the SmB6(001) surface annealed at (a) 900 and (b) 1030 °C. (c) LEED pattern of the sample annealed at 900 °C. Superstructure spots of c(2 × 2) and (1 × 2) or (2 × 1) are indicated by blue and green rectangles. (d) LEED pattern of the sample annealed at 1030 °C. LEED patterns are taken at the electron energy of 38 eV.
Figure 4(a) Atomically-resolved STM image of the SmB6(001) surface annealed at 1030 °C. (b) Zoomed STM image from (a). The image size corresponds to the rectangle in (a). (c) STM height profile along the green line in (b).
Figure 5(a) dI/dV spectra over a wide range of sample bias from −3.2 V to 2.2 V recorded on ordered (Sm-terminated), and disordered regions at T = 80 K. The arrow indicates the broad feature. (b) Temperature dependence of the spatially averaged dI/dV spectra near the Fermi energy. The dotted line on the dI/dV spectrum at T = 80 K is a Fano fit (see text) with a q-factor of 0.56, Γ of 21.6 ± 0.6 meV and E0 of ~ 8 meV. The arrow indicates the fine shoulder structure possibly derived from localized bulk f-states. (c) Spatial dependence of the dI/dV spectra near the Fermi energy recorded on the ordered region, and the disordered region near defects.