| Literature DB >> 28989708 |
Abstract
A synopsis of and prospects for de novo phasing using diffraction data collected at X-ray free-electron lasers are given.Entities:
Keywords: XFELs; anomalous signal; data quality; de novo phasing; serial femtosecond crystallography
Year: 2017 PMID: 28989708 PMCID: PMC5619844 DOI: 10.1107/S2052252517012167
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 4.769