Literature DB >> 28937740

Ab Initio Study of the Atomic Level Structure of the Rutile TiO2(110)-Titanium Nitride (TiN) Interface.

José Julio Gutiérrez Moreno1, Michael Nolan1.   

Abstract

Titanium nitride (TiN) is widely used in industry as a protective coating due to its hardness and resistance to corrosion and can spontaneously form a thin oxide layer when it is exposed to air, which could modify the properties of the coating. With limited understanding of the TiO2-TiN interfacial system at present, this work aims to describe the structural and electronic properties of oxidized TiN based on a density functional theory (DFT) study of the rutile TiO2(110)-TiN(100) interface model system, also including Hubbard +U correction on Ti 3d states. The small lattice mismatch gives a good stability to the TiO2-TiN interface after depositing the oxide onto TiN through the formation of interfacial Ti-O bonds. Our DFT+U study shows the presence of Ti3+ cations in the TiO2 region, which are preferentially located next to the interface region as well as the rotation of the rutile TiO2 octahedra in the interface structure. The DFT+U TiO2 electronic density of states (EDOS) shows localized Ti3+ defect states forming in the midgap between the top edge of the valence and the bottom of the conduction band. We increase the complexity of our models by the introduction of nonstoichiometric compositions. Although the vacancy formation energies for Ti in TiN (Evac (Ti) ≥ 4.03 eV) or O in the oxide (Evac (O) ≥ 3.40 eV) are quite high relative to perfect TiO2-TiN, defects are known to form during the oxide growth and can therefore be present after TiO2 formation. Our results show that a structure with exchanged O and N can lie 0.82 eV higher in energy than the perfect system, suggesting the stability of structures with interdiffused O and N anions at ambient conditions. The presence of N in TiO2 introduces N 2p states localized between the top edge of the O 2p valence states and the midgap Ti3+ 3d states, thus reducing the band gap in the TiO2 region for the exchanged O/N interface EDOS. The outcomes of these simulations give us a most comprehensive insight on the atomic level structure and the electronic properties of oxidized TiN surfaces.

Entities:  

Keywords:  TiN; TiO2; biofouling; defects; interface

Year:  2017        PMID: 28937740     DOI: 10.1021/acsami.7b08840

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  2 in total

1.  Enhanced Conductivity and Microstructure in Highly Textured TiN1-x /c-Al2O3 Thin Films.

Authors:  Alexander Zintler; Robert Eilhardt; Stefan Petzold; Sankaramangalam Ulhas Sharath; Enrico Bruder; Nico Kaiser; Lambert Alff; Leopoldo Molina-Luna
Journal:  ACS Omega       Date:  2022-01-03

2.  Metallic porous nitride single crystals at two-centimeter scale delivering enhanced pseudocapacitance.

Authors:  Shaobo Xi; Guoming Lin; Lu Jin; Hao Li; Kui Xie
Journal:  Nat Commun       Date:  2019-10-17       Impact factor: 14.919

  2 in total

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