| Literature DB >> 28937638 |
Pan Wang1, Wai Jack Sin2, Mui Ling Sharon Nai3, Jun Wei4.
Abstract
As one of the powder bed fusion additive manufacturing technologies, electron beam melting (EBM) is gaining more and more attention due to its near-net-shape production capacity with low residual stress and good mechanical properties. These characteristics also allow EBM built parts to be used as produced without post-processing. However, the as-built rough surface introduces a detrimental influence on the mechanical properties of metallic alloys. Thereafter, understanding the effects of processing parameters on the part's surface roughness, in turn, becomes critical. This paper has focused on varying the processing parameters of two types of contouring scanning strategies namely, multispot and non-multispot, in EBM. The results suggest that the beam current and speed function are the most significant processing parameters for non-multispot contouring scanning strategy. While for multispot contouring scanning strategy, the number of spots, spot time, and spot overlap have greater effects than focus offset and beam current. The improved surface roughness has been obtained in both contouring scanning strategies. Furthermore, non-multispot contouring scanning strategy gives a lower surface roughness value and poorer geometrical accuracy than the multispot counterpart under the optimized conditions. These findings could be used as a guideline for selecting the contouring type used for specific industrial parts that are built using EBM.Entities:
Keywords: 3D printing; multispot contouring; non-multispot contouring; processing parameter; surface roughness
Year: 2017 PMID: 28937638 PMCID: PMC5666927 DOI: 10.3390/ma10101121
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Illustration of (a) EBM system; (b) sample locations (each color indicated one sample); and (c) the picture of the EBM-built sample with dimensions (in mm). The thick arrow indicated the build direction and the thin arrows indicated the directions of the surface roughness measurements.
Figure 2Illustration of (a) non-mulitspot and (b) mulitspot contouring strategies.
Surface roughness results of non-multispot contouring. All the average values and standard deviations were obtained by measuring at least five values.
| Beam Current (mA) | Speed Function | Focus Offset (mA) | Vertical Surface Roughness (µm) | Horizontal Surface Roughness (µm) | |
|---|---|---|---|---|---|
| 2 | 2 | 3 | 33.6 ± 2.1 | 22.8 ± 1.9 | |
| 2 | 4 | 3 | 29.3 ± 1.3 | 23.1 ± 2.2 | |
| 2 | 6 | 3 | 33.3 ± 1.3 | 23.6 ± 1.1 | |
| 4 | 2 | 3 | 28.1 ± 1.8 | 21.6 ± 1.1 | |
| 4 | 4 | 0 | 24.1 ± 2.3 | 19.7 ± 1.3 | |
| 4 | 4 | 3 | 25.4 ± 2.1 | 21.7 ± 0.7 | |
| 4 | 6 | 0 | 33.5 ± 6.5 | 25.1 ± 3.3 | |
| 4 | 6 | 3 | 32.1 ± 4.6 | 31.2 ± 4.9 | |
| 6 | 4 | 0 | 31.0 ± 5.8 | 24.9 ± 5.2 | |
| 6 | 4 | 3 | 33.0 ± 4.9 | 24.3 ± 4.7 | |
| 6 | 6 | 0 | 33.8 ± 3.3 | 24.3 ± 2.7 | |
| 6 | 6 | 3 | 39.3 ± 6.7 | 30.9 ± 2.8 |
Surface roughness results of multispot contouring. All the average values and standard deviations were obtained by measuring at least five values.
| Number of Spots | Spot Time (ms) | Spot Overlap (mm) | Focus Offset (mA) | Beam Current (mA) | Vertical Surface Roughness (µm) | Horizontal Surface Roughness (µm) | |
|---|---|---|---|---|---|---|---|
| 10 | 0.6 | 0.2 | 1 | 4 | 40.5 ± 2.7 | 32.3 ± 2.3 | |
| 10 | 0.6 | 0.2 | 1 | 6 | 37.7 ± 2.9 | 29.2 ± 2.8 | |
| 10 | 0.6 | 0.2 | 3 | 4 | 38.2 ± 2.1 | 31.4 ± 2.9 | |
| 10 | 0.6 | 0.2 | 3 | 6 | 37.3 ± 3.5 | 28.4 ± 3.9 | |
| 10 | 0.8 | 0.4 | 3 | 4 | 32.6 ± 1.7 | 30.0 ± 1.4 | |
| 40 | 0.6 | 0.2 | 1 | 4 | 31.8 ± 1.9 | 31.5 ± 2.1 | |
| 40 | 0.6 | 0.2 | 1 | 6 | 31.8 ± 2.6 | 30.5 ± 2.9 | |
| 40 | 0.6 | 0.2 | 3 | 4 | 29.6 ± 2.3 | 28.9 ± 2.2 | |
| 40 | 0.6 | 0.2 | 3 | 6 | 33.6 ± 1.6 | 31.4 ± 1.3 | |
| 40 | 0.6 | 0.4 | 1 | 6 | 29.8 ± 1.5 | 29.7 ± 3.7 | |
| 40 | 0.8 | 0.2 | 1 | 6 | 33.0 ± 1.2 | 30.3 ± 1.4 | |
| 40 | 0.8 | 0.2 | 3 | 6 | 30.7 ± 1.4 | 29.1 ± 2.4 | |
| 40 | 0.8 | 0.4 | 1 | 4 | 31.6 ± 1.4 | 30.5 ± 2.0 | |
| 40 | 0.8 | 0.4 | 1 | 6 | 34.7 ± 3.1 | 33.0 ± 1.7 | |
| 40 | 0.8 | 0.4 | 3 | 4 | 30.9 ± 1.2 | 30.6 ± 2.0 | |
| 40 | 0.8 | 0.2 | 3 | 4 | 31.7 ± 1.9 | 31.0 ± 1.9 | |
| 55 | 0.4 | 0.4 | 3 | 4 | 27.3 ± 1.7 | 25.5 ± 3.2 | |
| 55 | 0.4 | 0.6 | 3 | 4 | 26.1 ± 0.9 | 27.0 ± 2.9 | |
| 55 | 0.8 | 0.4 | 3 | 4 | 32.4 ± 1.3 | 31.5 ± 2.1 | |
| 55 | 0.8 | 0.6 | 3 | 4 | 32.9 ± 1.3 | 30.6 ± 2.4 | |
| 70 | 0.4 | 0.4 | 3 | 4 | 28.9 ± 2.0 | 27.8 ± 1.9 | |
| 70 | 0.4 | 0.6 | 3 | 4 | 28.4 ± 1.2 | 25.8 ± 1.9 | |
| 70 | 0.8 | 0.4 | 3 | 4 | 35.1 ± 3.8 | 33.3 ± 2.3 | |
| 70 | 0.8 | 0.6 | 3 | 4 | 33.6 ± 1.9 | 32.3 ± 1.6 | |
| 80 | 0.4 | 0.4 | 3 | 4 | 27.9 ± 1.4 | 27.1 ± 1.9 | |
| 80 | 0.4 | 0.6 | 3 | 4 | 29.3 ± 1.7 | 28.0 ± 2.5 | |
| 80 | 0.8 | 0.4 | 3 | 4 | 34.2 ± 1.7 | 32.6 ± 2.0 | |
| 80 | 0.8 | 0.6 | 3 | 4 | 34.7 ± 1.5 | 33.5 ± 1.9 |
* The default processing parameters obtained from Arcam AB.
Figure 3Optical microscopy images showing the surface morphology of (a) N1; (b) N2; (c) N5 from the top view; and the surface conditions of (d) N6 from the side view.
Figure 4Optical microscopy images showing the surface morphology of (a) M3; (b) M9; (c) M14 from the top view; and the surface conditions of (d) M10 from the side view.
Figure 5Surface conditions of optimized processing parameters for (a) non-mulitspot (N6) and (b) mulitspot Ti-6Al-4V sample (M25) observed under Alicona IFM, where the characterized area is 6.5 × 6.5 mm. The arrows indicated the build direction.
Figure 6Optical microscope images showing the cross sections of (a) N6 and (b) M22.