| Literature DB >> 28879977 |
Li-Ming Si1,2, Tao Jiang3,4, Kihun Chang5, Te-Chuan Chen6, Xin Lv7, Lixin Ran8, Hao Xin9.
Abstract
Incorporation of active devices/media such as transistors for microwave and gain media for optics may be very attractive for enabling desired low loss and broadband metamaterials. Such metamaterials can even have gain which may very well lead to new and exciting physical phenomena. We investigate microwave composite right/left-handed transmission lines (CRLH-TL) incorporating ideal gain devices such as constant negative resistance. With realistic lumped element values, we have shown that the negative phase constant of this kind of transmission lines is maintained (i.e., left-handedness kept) while gain can be obtained (negative attenuation constant of transmission line) simultaneously. Possible implementation and challenging issues of the proposed active CRLH-TL are also discussed.Entities:
Keywords: active metamaterial; composite right/left-handed transmission line (CRLH-TL); dispersion/attenuation relation; negative resistance device
Year: 2010 PMID: 28879977 PMCID: PMC5448474 DOI: 10.3390/ma4010073
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Equivalent circuit model of a unit cell of a general metamaterial CRLH-TL (active scenario: negative R and/or negative G).
Figure 4(a) Attenuation constant α and (b) phase constant β, of several CRLH-TLs with different series resistance values.
Figure 2Scattering parameters and sign function of the active CRLH-TL unit cell.
Figure 3Parameters of the active CRLH-TL metamaterial as a function of frequency: (a) Attenuation constant α (solid line) and phase constant β (dotted line); (b) Real and imaginary part of the effective index of refraction neff (assuming a realistic unit cell physical length of 3 mm); (c) Real and imaginary part of the effective permittivity εeff (assuming a realistic unit cell physical length of 3 mm); (d) Real and imaginary part of the effective permeability µeff (assuming a realistic unit cell physical length of 3 mm).
Figure 5(a) Attenuation constant α and (b) phase constant β, of several CRLH-TLs with different shunt conductance values.
Figure 6(a) Simplified schematic of a negative resistance circuit using a pair of transistors; (b) Fabricated negative resistance realization using GaAs PHEMT devices in a microstrip test fixture.
Figure 7(a) Measured one-port S-parameters (circles are the reflection coefficients with port 2 grounded; and squares are the reflection coefficients with port 1 grounded) of the negative resistance circuit using a pair of transistors; (b) Calculated equivalent resistances from the measured one-port S-parameters (circles are the resistance seen at port 1 with port 2 grounded; and squares are the resistance seen at port 2 with port 1 grounded).