| Literature DB >> 28879965 |
Luigi Russo1, Francesco Colangelo2, Raffaele Cioffi3, Ilaria Rea4, Luca De Stefano5.
Abstract
Porous silicon samples have been reduced in nanometric particles by a well known industrial mechanical process, the ball grinding in a planetary mill; the process has been extended to crystalline silicon for comparison purposes. The silicon nanoparticles have been studied by X-ray diffraction, infrared spectroscopy, gas porosimetry and transmission electron microscopy. We have estimated crystallites size from about 50 nm for silicon to 12 nm for porous silicon. The specific surface area of the powders analyzed ranges between 100 m²/g to 29 m²/g depending on the milling time, ranging from 1 to 20 h. Electron microscopy confirms the nanometric size of the particles and reveals a porous structure in the powders obtained by porous silicon samples which has been preserved by the fabrication conditions. Chemical functionalization during the milling process by a siloxane compound has also been demonstrated.Entities:
Keywords: ball milling; nanopowders; porous silicon
Year: 2011 PMID: 28879965 PMCID: PMC5448639 DOI: 10.3390/ma4061023
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Experimental working conditions.
| Sample | Substrate | Mass (g) | Ball-to-powder | Time (h) |
|---|---|---|---|---|
| cSi-0.1 | monocrystalline | 0.399 | 10:1 | 0.1 |
| cSi-0.5 | monocrystalline | 0.570 | 10:1 | 0.5 |
| cSi-2 | monocrystalline | 0.575 | 10:1 | 2 |
| cSi-5 | monocrystalline | 0.561 | 10:1 | 5 |
| cSi-10 | monocrystalline | 0.562 | 10:1 | 10 |
| cSi-20 | monocrystalline | 0.564 | 10:1 | 20 |
| cSi-20b | monocrystalline | 1.878 | 20:1 | 20 |
| cSi-0.1b | monocrystalline | 1.497 | 20:1 | 0.1 |
| pSi-0.1 | porous | 0.916 | 20:1 | 0.1 |
| pSi-2 | porous | 0.909 | 20:1 | 2 |
| pSi-4 | porous | 0.900 | 20:1 | 4 |
Figure 1X-ray powder diffraction (XRPD) patterns for crystalline samples: (a) samples milled 0.1 h, 1 h, 10 h and 20 h with a 10:1 b/p ratio; (b) samples milled 0.1 h and 20 h with a 20:1 b/p ratio.
Figure 2XRPD patterns for porous samples: (a) pSi-0.1 sample milled 0.1 h, and (b) pSi-2 sample milled 2 h: the SiO2 phase is detected.
Crystallites size obtained by means of Scherrer equation.
| Sample | Crystallites size (nm) | ||||
|---|---|---|---|---|---|
| (111) | (220) | (311) | (400) | (331) | |
| cSi-0.1b | 56 ± 1 | 58 ± 1 | 42 ± 1 | ||
| cSi-20b | 16 ± 1 | 13 ± 1 | 11 ± 1 | ||
| pSi-0.1 | 36 ± 2 | 26 ± 4 | 25 ± 3 | 22 ± 3 | 23 ± 3 |
| pSi-2 | 12 ± 2 | 10 ± 1 | 10 ± 1 | 10 ± 1 | 8 ± 1 |
Crystallites size obtained by means of Williamson-Hall plot.
| Sample | Kλ/d | η | d (nm) |
|---|---|---|---|
| cSi-0.1b | 0.002 ± 0.001 | ~ 0 | 62 ± 30 |
| cSi-20b | 0.0073 ± 0.0008 | 0.004 ± 0.002 | 19 ± 2 |
| pSi-0.1 | 0.0023 ± 0.0002 | 0.0064 ± 0.0008 | 59 ± 6 |
| pSi-2 | 0.009 ± 0.002 | 0.011 ± 0.003 | 15 ± 3 |
Figure 3Fourier-transform infrared spectroscopy (FT-IR) spectra for the crystalline samples: (a) milled at 0.1 h and 20 h; (b) porous samples milled at 0.1 h, 2 h and 4 h.
Figure 4Transmission electron microscopy (TEM) images of crystalline samples milled 20 h (a) and particle distribution obtained (b).
Figure 5TEM images of the porous samples: (a) sample milled 2 h; (b) sample after sonication; (c) zoomed image of some particles, (d) particles size distribution of porous sample milled 2 h.
Figure 6FT-IR spectra for porous sample milled 2 h and the same sample after silanization with APTES.