Bogdan I Tsykaniuk1, Andrii S Nikolenko2, Viktor V Strelchuk2, Viktor M Naseka2, Yuriy I Mazur3, Morgan E Ware3, Eric A DeCuir3, Bogdan Sadovyi4, Jan L Weyher4, Rafal Jakiela5, Gregory J Salamo3, Alexander E Belyaev2. 1. V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, Kiev, 03680, Ukraine. btsykaniuk@gmail.com. 2. V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, Kiev, 03680, Ukraine. 3. Institute for Nanoscience and Engineering, University of Arkansas, West Dickson 731, Fayetteville, AR, 72701, USA. 4. Institute of High Pressure Physics, Polish Academy of Sciences, Sokolowska str. 29/37, 01-142, Warsaw, Poland. 5. Institute of Physics, Polish Academy of Sciences, Al. Lotnikow 32/46, PL-02-668, Warsaw, Poland.
In the original publication [1] was equation 2 not correctly displayed in the online PDF.Furthermore reference 1 and 2 were incorrect. The correct versions can found below:Incorrect equation in the online PDF:Correct equation in the online article:Incorrect reference 11. Manasreh MO, Weaver BD (2001) Local vibrational modes of carbonhydrogen complexes in proton irradiated AlGaN. Mater Res 692:403–409Should be exchanged with this one:Davis RF (1991) III-V Nitrides for Electronic and Optoelectronic Applications. Proc IEEE 79: 702-712Incorrect reference 22. Sun WH, Chen KM, Yang ZJ, Li J, Tong YZ, Jin SX, Zhang GY, Zhang QL, Qin GG (1999) Using Fourier transform infrared grazing incidence reflectivity to study local vibrational modes in GaN. J Appl Phys 85:6430–6433Should be exchanged with this one:Xing H, Keller S, Wu Y-F, et al (2001) Gallium nitride based transistors. J Phys Condens Matter 7139: 7139-7157The equation in the online article has been updated to rectify this error.
Authors: Bogdan I Tsykaniuk; Andrii S Nikolenko; Viktor V Strelchuk; Viktor M Naseka; Yuriy I Mazur; Morgan E Ware; Eric A DeCuir; Bogdan Sadovyi; Jan L Weyher; Rafal Jakiela; Gregory J Salamo; Alexander E Belyaev Journal: Nanoscale Res Lett Date: 2017-06-08 Impact factor: 4.703