Literature DB >> 28825806

Atomically Abrupt Topological p-n Junction.

Sung Hwan Kim1, Kyung-Hwan Jin2, Byung Woo Kho, Byeong-Gyu Park, Feng Liu2,3, Jun Sung Kim, Han Woong Yeom1.   

Abstract

Topological insulators (TI's) are a new class of quantum matter with extraordinary surface electronic states, which bear great potential for spintronics and error-tolerant quantum computing. In order to put a TI into any practical use, these materials need to be fabricated into devices whose basic units are often p-n junctions. Interesting electronic properties of a 'topological' p-n junction were proposed theoretically such as the junction electronic state and the spin rectification. However, the fabrication of a lateral topological p-n junction has been challenging because of materials, process, and fundamental reasons. Here, we demonstrate an innovative approach to realize a p-n junction of topological surface states (TSS's) of a three-dimensional (3D) topological insulator (TI) with an atomically abrupt interface. When a ultrathin Sb film is grown on a 3D TI of Bi2Se3 with a typical n-type TSS, the surface develops a strongly p-type TSS through the substantial hybridization between the 2D Sb film and the Bi2Se3 surface. Thus, the Bi2Se3 surface covered partially with Sb films bifurcates into areas of n- and p-type TSS's as separated by atomic step edges with a lateral electronic junction of as short as 2 nm. This approach opens a different avenue toward various electronic and spintronic devices based on well-defined topological p-n junctions with the scalability down to atomic dimensions.

Entities:  

Keywords:  angle-resolved photoemission spectroscopy; scanning tunneling microscopy/spectroscopy; topological insulator; topological p−n junction; ultrathin Sb film

Year:  2017        PMID: 28825806     DOI: 10.1021/acsnano.7b03880

Source DB:  PubMed          Journal:  ACS Nano        ISSN: 1936-0851            Impact factor:   15.881


  1 in total

1.  Emergent and Tunable Topological Surface States in Complementary Sb/Bi2Te3 and Bi2Te3/Sb Thin-Film Heterostructures.

Authors:  Yao Li; John W Bowers; Joseph A Hlevyack; Meng-Kai Lin; Tai-Chang Chiang
Journal:  ACS Nano       Date:  2022-06-14       Impact factor: 18.027

  1 in total

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