| Literature DB >> 28817587 |
Way-Ren Huang1, Chia-Jen Hsieh2, Ke-Chiun Chang3,4, Yen-Jo Kiang3, Chien-Chung Yuan2, Woei-Chyn Chu1.
Abstract
This study proposes a different angle to social network analysis that evaluates patent value and explores its influencing factors using the network centrality and network position. This study utilizes a logistic regression model to explore the relationships in the LED industry between patent value and network centrality as measured from out-degree centrality, in-degree centrality, in-closeness centrality, and network position, which is measured from effect size. The empirical result shows that out-degree centrality and in-degree centrality have significant positive effects on patent value and that effect size has a significant negative effect on patent value.Entities:
Mesh:
Year: 2017 PMID: 28817587 PMCID: PMC5560636 DOI: 10.1371/journal.pone.0181988
Source DB: PubMed Journal: PLoS One ISSN: 1932-6203 Impact factor: 3.240
Descriptive statistics.
| Variables | Min. | Max. | Mean | S. D. |
|---|---|---|---|---|
| 1. OutDegree | 0 | 134 | 2.97 | 7.84 |
| 2. InDegree | 0 | 292 | 2.97 | 7.36 |
| 3. InCloseness | 0.021 | 0.028 | 0.021 | 0.0003 |
| 4. EffSize | 0 | 288.51 | 5.48 | 10.31 |
| 5. PatInventor | 1 | 15 | 2.92 | 1.85 |
| 6. PatTechScope | 1 | 13 | 1.66 | 0.95 |
| 7. Claim | 1 | 169 | 17.35 | 14.70 |
| 8. PatFamily | 1 | 330 | 8.83 | 21.12 |
Correlations matrix.
| Variables | 1. | 2. | 3. | 4. | 5. | 6. | 7. | 8. |
|---|---|---|---|---|---|---|---|---|
| 1. LitigatedPat | 1 | |||||||
| 2. OutDegree | 0.13 | 1 | ||||||
| 3. InDegree | 0.05 | 0.04 | 1 | |||||
| 4. InCloseness | 0.02 | -0.06 | 0.64 | 1 | ||||
| 5. EffSize | 0.12 | 0.74 | 0.70 | 0.38 | 1 | |||
| 6. PatInventor | 0.02 | 0.03 | 0.08 | 0.05 | 0.07 | 1 | ||
| 7. PatTechScope | 0.03 | -0.02 | -0.05 | -0.07 | -0.05 | 0.04 | 1 | |
| 8. Claim | 0.05 | 0.06 | 0.16 | 0.14 | 0.14 | 0.11 | 0.07 | 1 |
| 9. PatFamily | 0.09 | 0.04 | 0.22 | 0.19 | 0.17 | 0.15 | 0.18 | 0.20 |
**p<0.05,
*p<0.1
Characteristics of litigated patents and non-litigated patents.
| Variables | Litigated patent | Non-Litigated patent | t-value | p-value |
|---|---|---|---|---|
| 1. OutDegree | 11.76 | 2.86 | 8.733 | 0.000 |
| 2. InDegree | 6.02 | 2.94 | 3.198 | 0.001 |
| 3. InCloseness | 0.021 | 0.021 | 1.320 | 0.187 |
| 4. EffSize | 16.42 | 5.35 | 8.254 | 0.000 |
| 5. PatInventor | 3.25 | 2.29 | 1.401 | 0.161 |
| 6. PatTechScope | 1.95 | 1.66 | 2.309 | 0.021 |
| 7. Claim | 23.49 | 17.28 | 3.229 | 0.001 |
| 8. PatFamily | 26.71 | 8.61 | 6.574 | 0.000 |
**p<0.01,
*p<0.05
Result of traditional logit model and rare events logit model.
| Variables | Traditional logit model | Marginal effects | Rare events logit model |
|---|---|---|---|
| Intercept | -0.73 | -1.42 | |
| Independent variables | |||
| OutDegree | 0.23 | 0.003 | 0.22 |
| InDegree | 0.22 | 0.003 | 0.22 |
| InCloseness | -219.34 | -2.54 | -187.42 |
| EffSize | -0.21 | -0.002 | -0.20 |
| Control variables | |||
| PatInventor | 0.03 | 0.0003 | 0.03 |
| PatTechScope | 0.13 | 0.002 | 0.14 |
| Claim | 0.007 | 0.0000 | 0.008 |
| PatFamily | 0.009 | 0.0001 | 0.009 |
| -2 Log Likelihood | 584.43 | N.A. | |
| Prob > χ2 | 0.000 | N.A. | |
**p<0.01,
*p<0.05.
Robust Standard errors are reported in parentheses.