| Literature DB >> 28808431 |
Ti-Yen Lan1, Jennifer L Wierman2,3, Mark W Tate1, Hugh T Philipp1, Veit Elser1, Sol M Gruner1,2,3,4.
Abstract
Recently, there has been a growing interest in adapting serial microcrystallography (SMX) experiments to existing storage ring (SR) sources. For very small crystals, however, radiation damage occurs before sufficient numbers of photons are diffracted to determine the orientation of the crystal. The challenge is to merge data from a large number of such 'sparse' frames in order to measure the full reciprocal space intensity. To simulate sparse frames, a dataset was collected from a large lysozyme crystal illuminated by a dim X-ray source. The crystal was continuously rotated about two orthogonal axes to sample a subset of the rotation space. With the EMC algorithm [expand-maximize-compress; Loh & Elser (2009). Phys. Rev. E, 80, 026705], it is shown that the diffracted intensity of the crystal can still be reconstructed even without knowledge of the orientation of the crystal in any sparse frame. Moreover, parallel computation implementations were designed to considerably improve the time and memory scaling of the algorithm. The results show that EMC-based SMX experiments should be feasible at SR sources.Entities:
Keywords: EMC algorithm; X-ray serial microcrystallography; protein microcrystallography; sparse data; synchrotron radiation sources
Year: 2017 PMID: 28808431 PMCID: PMC5541350 DOI: 10.1107/S1600576717006537
Source DB: PubMed Journal: J Appl Crystallogr ISSN: 0021-8898 Impact factor: 3.304
Figure 1A simplified schematic of the experimental setup with two orthogonal rotation axes. The beam incidence is perpendicular to the ψ axis and the MM-PAD, and the main beam is blocked by the beamstop. The crystal is rotated in increments of 0.1° about the ψ axis, with the data frames recorded by the MM-PAD when φ traverses 360° continuously at each value of ψ. The figure is not drawn to scale.
Figure 2(a) Histogram of the number of peaks per collapsed frame, which is the sum of 100 successive frames in the raw data. A patch with more than two connected pixels and an average of no less than two photons per pixel is identified as a peak. (b) A random selection of the collapsed frames, with identified peaks marked with blue circles. The cross denotes the beam center, and the resolution at the upper right corner is about 2 Å.
Figure 3The average signal-to-noise ratio of the integrated reflections from the converged intensity maps at different stages of the reconstruction. The increase of at high q indicates the reconstruction of high-resolution peaks. The 2.27 Å resolution determined by CC* is marked by the black dashed line.
Figure 4Slices of the reconstructed and reference intensity maps in the hl plane at constant values of k of the reciprocal lattice. Even without imposing any symmetry in the process of seeding or reconstruction, the converged intensity map still follows the reflection condition required by the space-group symmetry of the HEWL crystal (see insets). The 2.27 Å resolution determined by is marked by the arcs in white. The mapping into reciprocal space transforms the detector gaps (Tate et al., 2013 ▸) into curves.
Figure 5Scatter plot comparing the integrated reflections from the reconstructed and reference intensity maps. Reflections with the signal-to-noise ratio are excluded from the plot. The linear correlation shows the agreement between the two intensity maps.
Figure 6The distribution of as a function of spatial frequencies. The resolution of the reflections is determined as 2.27 Å by a threshold . The error bars are estimated by repeating the random separation of reflections 1000 times, while the ups and downs in result from the binning in resolution shells.