| Literature DB >> 28788272 |
Muhammad Yusri Abdul Halim1, Wei Leng Tan2, Noor Hana Hanif Abu Bakar3, Mohamad Abu Bakar4.
Abstract
Porous structured silicon or porous silicon (PS) powder was prepared by chemical etching of silicon powder in an etchant solution of HF: HNO₃: H₂O (1:3:5 v/v). An immersion time of 4 min was sufficient for depositing Cu metal from an aqueous solution of CuSO₄ in the presence of HF. Scanning electron microscopy (SEM) analysis revealed that the Cu particles aggregated upon an increase in metal content from 3.3 wt% to 9.8 wt%. H₂-temperature programmed reduction (H₂-TPR) profiles reveal that re-oxidation of the Cu particles occurs after deposition. Furthermore, the profiles denote the existence of various sizes of Cu metal on the PS. The Cu-PS powders show excellent catalytic reduction on the p-nitrophenol regardless of the Cu loadings.Entities:
Keywords: Cu particles; p-nitrophenol; porous silicon powder; surface properties
Year: 2014 PMID: 28788272 PMCID: PMC5456440 DOI: 10.3390/ma7127737
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1SEM images of (a) powdered silicon and (b) porous silicon (PS) powder after 4 min of etching.
Figure 2SEM images of Cu particles deposited on PS powder with a metal loading of (a) 3.3 wt%, (b) 7.8 wt% and (c) 9.8 wt%.
Figure 3SEM-EDX analysis for a typical Cu-PS powder sample. (a) SEM micrograpgh; (b) EDX spectrum of the boxed area in (a).
Surface area, particle size of Cu°, H2 consumption and production for various samples.
| Notation | Cu° Content * (wt%) | BET Surface Area (m2·g−1) | Cu° Particle Size | H2 Consumed (mol·gmetal−1) | H2 Produced (mol·gmetal−1) |
|---|---|---|---|---|---|
| PS | 0 | 3.10 | N/A | Nil | Nil |
| 3.3 wt% Cu-PS | 3.3 | 5.42 | 0.9 ± 0.5 μm | 5.70 × 10−3 | 3.27 × 10−3 |
| 7.8 wt% Cu-PS | 7.8 | 20.52 | 4.1 ± 1.0 μm | 4.41 × 10−3 | 3.33 × 10−4 |
| 9.8 wt% Cu-PS | 9.8 | 3.51 | Highly agglomerated | 2.88 × 10−3 | 9.59 × 10−4 |
* Determined via AAS.
Figure 4H2-temperature program reduction (TPR) profiles of the PS and various wt% of Cu-PS powder samples.
Figure 5SEM images of the 7.8 wt% Cu-PS sample after H2-TPR analysis at magnifications of (a) 2000×; (b) 5000×.
Figure 6Schematic diagrams for (a) H2 consumption and (b) H2 production reactions.
Figure 7UV spectra of solution containing p-nitrophenol and KBH4 with (PS or Cu-PS) and without catalysts at 1 min of reaction.