| Literature DB >> 28788200 |
Arturo Rodríguez Gómez1, Carlos Moises Sánchez-Hernández2, Ilán Fleitman-Levin2, Jesús Arenas-Alatorre3, Juan Carlos Alonso-Huitrón4, María Elena Sánchez Vergara5.
Abstract
The interest of microelectronics industry in new organic compounds for the manufacture of luminescent devices has increased substantially in the last decade. In this paper, we carried out a study of the usage feasibility of three organic bidentate ligands (2,6-dihydroxyanthraquinone, anthraflavic acid and potassium derivative salt of anthraflavic acid) for the synthesis of an organic semiconductor based in silicon phthalocyanines (SiPcs). We report the visible photoluminescence (PL) at room temperature obtained from thermal-evaporated thin films of these new materials. The surface morphology of these films was analyzed by atomic force microscopy (AFM) and scanning electron microscopy (SEM). AFM indicated that the thermal evaporation technique is an excellent resource in order to obtain low thin film roughness when depositing these kinds of compounds. Fourier transform infrared spectroscopy (FTIR) spectroscopy was employed to investigate possible changes in the intra-molecular bonds and to identify any evidence of crystallinity in the powder compounds and in the thin films after their deposition. FTIR showed that there was not any important change in the samples after the thermal deposition. The absorption coefficient (α) in the absorption region reveals non-direct transitions. Furthermore, the PL of all the investigated samples were observed with the naked eye in a bright background and also measured by a spectrofluorometer. The normalized PL spectra showed a Stokes shift ≈ 0.6 eV in two of our three samples, and no PL emission in the last one. Those results indicate that the Vis PL comes from a recombination of charge carriers between conduction band and valence band preceded by a non-radiative relaxation in the conduction band tails.Entities:
Keywords: absorption spectra; optical properties; photoluminescence (PL); thin films
Year: 2014 PMID: 28788200 PMCID: PMC5456141 DOI: 10.3390/ma7096585
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1General reaction to obtain SiPcL2 derivatives. SiPc: silicon phthalocyanines.
Characteristic Fourier transform infrared spectroscopy (FTIR) bands for KBr pellets and thin films (cm−1). MPc: metal phthalocyanines; and SiPcCl2: chloro ligands of SiPc molecule.
| MPc | ν (CH) cm−1 | ν (C–C) cm−1 | ν (C–N) cm−1 | ν (C=O) cm−1 | ν (C–O) cm−1 | α-form cm−1 | β-form cm−1 |
|---|---|---|---|---|---|---|---|
| Compound | 3068, 3056, 2934, 2806, 1116, 900, 732 | 1617, 685 | 1291, 1163 | 1663 | 1075 | - | 781, 734 |
| Compound | 3073, 3056, 2937, 2805, 1121, 908, 734 | 1613, 681 | 1288, 1164 | 1663 | 1078 | - | - |
| Compound | 3079, 3062, 2934, 2800, 1122, 912, 732 | 1606, 685 | 1291, 1163 | 1664 | 1075 | 720 | 781, 737 |
| Compound | 3071, 3058, 2937, 2801, 1118, 907, 723 | 1612, 684 | 1288, 1165 | 1662 | 1076 | - | - |
| Compound | 3079, 3056, 2934, 2800, 1116, 906, 731 | 1612, 679 | 1285, 1163 | 1664 | 1076 | 728 | 782, 735 |
| Compound | 3085, 3056, 2935, 2801, 1120, 1077, 908, 735 | 1611, 683 | 1289, 1165 | 1662 | 1077 | - | - |
| SiPcCl2: pellet | 3087, 3059, 1116, 2937, 2801, 907, 718 | 1612, 684 | 1286, 1160 | - | 1073 | - | 781, 737 |
| SiPcCl2: thin film | 3085, 3058, 1115, 2937, 2803, 908, 720 | 1612, 682 | 1289, 1165 | - | 1076 | - | - |
Figure 2Scanning electron microscopy (SEM) micrographs of: (a) Compound A; (b) Compound B; and (c) Compound C films at 1500×.
Figure 3Atomic force microscopy (AFM) images for: (a) Compound A; (b) Compound B; and (c) Compound C films deposited on Q-substrate.
Characteristic parameters of thin-films under investigation. RMS: root mean square.
| Sample | RMS roughness (nm) | Refractive index ( | % Reflectance | Thickness (nm) | Cody
|
|---|---|---|---|---|---|
| Compound | 69.19 | 2.022 | 11.44 | 542 | 1.7, 2.1, 3.1 |
| Compound | 14.53 | 2.621 | 20.04 | 1319 | 1.6, 2.5 |
| Compound | 110.42 | 2.696 | 21.11 | 1562 | 1.6, 2.4 |
a Eg: band gap.
Figure 4Plot of (α/hν)1/2 vs. photon energy hν of thin Films A, B and C deposited on Q-substrate.
Figure 5X-ray diffraction (XRD) pattern of thin Films A, B and C.
Figure 6(a) Photoluminescence (PL); and (b) absorbance spectra of thin Films A, B, and C; (c) PL normalized to the thickness of each film.
Figure 7Normalized PL and absorbance vs. photon energy of thin films: (a) Film A; (b) Film B; and (c) Film C.