| Literature DB >> 28773659 |
María D Manrique-Juárez1,2, Iurii Suleimanov3,4, Edna M Hernández5, Lionel Salmon6, Gábor Molnár7, Azzedine Bousseksou8.
Abstract
Topographic images of [Fe(Htrz)₂(trz)](BF₄) nanoparticles were acquired across the first-order spin transition using variable-temperature atomic force microscopy (AFM) in amplitude modulation mode. These studies revealed a complex morphology of the particles consisting of aggregates of small nanocrystals, which expand, separate and re-aggregate due to the mechanical stress during the spin-state switching events. Both reversible (prompt or slow recovery) and irreversible effects (fatigue) on the particle morphology were evidenced and correlated with the spin crossover properties.Entities:
Keywords: atomic force microscopy; microstructures; spin crossover
Year: 2016 PMID: 28773659 PMCID: PMC5456918 DOI: 10.3390/ma9070537
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1(a) Temperature dependence of the product of molar magnetic susceptibility and temperature for 1 over the first (open symbols) and second (closed symbols) thermal cycles. Heating and cooling are indicated by arrows; (b) Representative SEM image of the particles of 1.
Figure 2AFM height images and cross-sections of a particle of 1 acquired in different spin states at 358 K over a complete thermal cycle. From left to right: LS, HS and LS states. Images were recorded at 512 × 512 pixels at a line rate of 2 Hz. The z-scales range from 0 to 168 nm.
Figure 3AFM images of 1 acquired during a complete thermal cycle. From left to right: LS (303 K), HS (360 K) and LS (360 K) states. From top to bottom: height (scan size: 3 × 3 μm2 and 1 × 1 μm2), phase and amplitude signals. Images were recorded at 512 × 512 pixels at a line rate of 1 Hz. The z-scale ranges from 0 to 300 nm (height) and from 0 to 90 degrees (phase).
Evolution of surface roughness parameters through the spin transition (3 × 3 μm2 area).
| Spin State | LS (303 K) | HS (360 K) | LS (360 K) |
|---|---|---|---|
| Ra (nm) | 28 ± 4 | 23 ± 6 | 28 ± 6 |
| Rq (nm) | 34 ± 5 | 29 ± 7 | 34 ± 7 |
Figure 4High resolution AFM topography images acquired at 303 K (a) on the fresh sample and (b) after eight thermal cycles. Images were recorded at 512 × 512 pixels at a line rate of 2 Hz. The scan size was (a) 200 × 200 nm2 and (b) 220 × 220 nm2.