| Literature DB >> 28773611 |
Clara Musa1, Roberta Licheri2, Roberto Orrù3, Giacomo Cao4, Diletta Sciti5, Laura Silvestroni6, Luca Zoli7, Andrea Balbo8,9, Luca Mercatelli10, Marco Meucci11, Elisa Sani12.
Abstract
In the present study, nearly fully dense monolithic ZrC samples are produced and broadly characterized from microstructural, mechanical and optical points of view. Specifically, 98% dense products are obtained by Spark Plasma Sintering (SPS) after 20 min dwell time at 1850 °C starting from powders preliminarily prepared by Self-propagating High-temperature Synthesis (SHS) followed by 20 min ball milling. A prolonged mechanical treatment up to 2 h of SHS powders does not lead to appreciable benefits. Vickers hardness of the resulting samples (17.5 ± 0.4 GPa) is reasonably good for monolithic ceramics, but the mechanical strength (about 250 MPa up to 1000 °C) could be further improved by suitable optimization of the starting powder characteristics. The very smoothly polished ZrC specimen subjected to optical measurements displays high absorption in the visible-near infrared region and low thermal emittance at longer wavelengths. Moreover, the sample exhibits goodspectral selectivity (2.1-2.4) in the 1000-1400 K temperature range. These preliminary results suggest that ZrC ceramics produced through the two-step SHS/SPS processing route can be considered as attractive reference materials for the development of innovative solar energy absorbers.Entities:
Keywords: Spark Plasma Sintering; carbides; mechanical properties; optical properties; self-propagating high-temperature synthesis; ultra-high-temperature-ceramics
Year: 2016 PMID: 28773611 PMCID: PMC5456769 DOI: 10.3390/ma9060489
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1XRD patterns of starting reactants (a); and SHS product (b).
Particle size characteristics, as determined by laser scattering analysis, and crystallite size, obtained using the Rietveld analytical procedure, of differently ball-milled SHSed powders.
| 5 | 1.50 ± 0.06 | 9.20 ± 0.11 | 29.90 ± 1.65 | 12.60 ± 0.25 | >200 |
| 20 | 0.61 ± 0.03 | 3.68 ± 0.01 | 10.12 ± 0.21 | 4.59 ± 0.04 | 137.3 ± 1.2 |
| 120 | 0.11 ± 0.01 | 1.55 ± 0.32 | 34.10 ± 5.85 | 8.99 ± 1.58 | 44.2 ± 0.1 |
Figure 2SEM images of SHS ZrC powders milled at different time intervals (t): 5 min (a); 20 min (b); and 120 min (c).
Figure 3Effect of milling time on the relative density of ZrC samples obtained by SPS (T = 1850 °C, t = 10 min, p = 50 MPa).
Figure 4Effect of (a) the sintering temperature (t = 20 min, p = 50 MPa, t = 10 min) and (b) dwell time (T = 1850 °C, p = 50 MPa, t = 10 min) on the density of ZrC samples obtained by SPS.
Figure 5SEM image of the fracture surface of ZrC product obtained by SPS (T = 1850 °C, p = 50 MPa, t = 10 min, t = 20 min).
Figure 6SEM images of the polished surface of the SHS-SPSed ZrC sample showing (a) a microstructure overview in back-scattered image mode and (b) the presence of closed porosity and carbon inclusions in In-lens mode with the EDS spectrum of C-rich pockets inset.
Description and average (Av.) values of the measured two-dimensional (2D) and three-dimensional (3D) surface parameters.
| 2D Parameters | Av. Values | Description |
|---|---|---|
| 0.009 ± 0.004 | Arithmetic Mean Deviation of the roughness profile. | |
| 0.014 ± 0.006 | Root-Mean-Square (RMS) Deviation of the roughness profile. | |
| −0.91 ± 0.15 | Skewness of the roughness profile. | |
| 4.90 ± 0.56 | Kurtosis of the roughness profile. | |
| 0.020 ± 0.012 | Maximum Peak Height of the roughness profile. | |
| 0.047 ± 0.017 | Maximum Valley Depth of the roughness profile. | |
| 0.068 ± 0.028 | Maximum height of roughness profile on the sampling length. | |
| 0.043 ± 0.020 | Mean height of the roughness profile elements. | |
| 1.29 ± 0.77 | Total height of roughness profile (on the evaluation length). | |
| 0.076 ± 0.012 | Mean Width of the roughness profile elements. | |
| 0.43 ± 0.19 | Root-Mean-Square Slope of the roughness profile. | |
| 0.070 ± 0.030 | Arithmetic mean height of the S-L Surface. | |
| 0.56 ± 0.16 | Root mean square height of the S-L Surface. | |
| −11.4 ± 5.2 | Skewness of the S-L Surface. | |
| 150 ± 70 | Kurtosis of the S-L Surface. | |
| 11.0 ± 3.10 | Maximum peak height in the S-L Surface. | |
| 19.6 ± 1.60 | Maximum pit height of the S-L Surface. | |
| 30.6 ± 4.7 | Maximum height of the S-L Surface. |
Figure 7Hemispherical reflectance spectrum of ZrC sample.