| Literature DB >> 28772917 |
Fan Yang1, Liang Zhang2,3, Zhi-Quan Liu4, Su Juan Zhong5, Jia Ma6, Li Bao7.
Abstract
With the purpose of improving the properties of the Sn-58Bi lead-free solder, micro-CuZnAl particles ranging from 0 to 0.4 wt % were added into the low temperature eutectic Sn-58Bi lead-free solder. After the experimental testing of micro-CuZnAl particles on the properties and microstructure of the Sn-58Bi solders, it was found that the wettability of the Sn-58Bi solders was obviously improved with addition of CuZnAl particles. When the addition of CuZnAl particles was 0.2 wt %, the wettability of the Sn-58Bi solder performed best. At the same time, excessive addition of CuZnAl particles led to poor wettability. However, the results showed that CuZnAl particles changed the melting point of the Sn-58Bi solder slightly. The microstructure of the Sn-58Bi solder was refined by adding CuZnAl particles. When the content of CuZnAl addition was between 0.1 and 0.2 wt %, the refinement was great. In addition, the interfacial IMC layer between new composite solder and Cu substrate was thinner than that between the Sn-58Bi solder and Cu substrate.Entities:
Keywords: Sn-58Bi solder; lead-free solder; microstructure
Year: 2017 PMID: 28772917 PMCID: PMC5458988 DOI: 10.3390/ma10050558
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Series of investigation solders.
| Sample Number | 1 | 2 | 3 | 4 | 5 | 6 |
| CuZnAl/(wt %) | 0 | 0.05 | 0.1 | 0.2 | 0.3 | 0.4 |
| Initial alloy | Sn-58Bi | |||||
Figure 1Reflow soldering curve of Sn–Bi base solders.
Figure 2Schematic illustration of Sn–Bi base solders’ spreading test.
Figure 3SEM of CuZnAl particles.
Figure 4Spreading area of Sn-58Bi-xCuZnAl composite solders.
Figure 5The melting characteristics of Sn-58Bi-xCuZnAl; (a) x = 0; (b) x = 0.05; (c) x = 0.1; (d) x = 0.2; (e) x = 0.3; (f) x = 0.4.
Figure 6Microstructures of Sn-58Bi-xCuZnAl after reflow; (a) x = 0; (b) x = 0.05; (c) x = 0.1; (d) x = 0.2; (e) x = 0.3; (f) x = 0.4.
Figure 7Interfacial IMC layers of Sn-58Bi-xCuZnAl after reflow; (a) x = 0; (b) x = 0.05; (c) x = 0.1; (d) x = 0.2; (e) x = 0.3; (f) x = 0.4.
Figure 8SEM morphology and EDX line scan profiles of interface between Sn-58Bi and Cu substrate.
Figure 9Average intermetallic compound layer thickness of Sn58Bi-xCuZnAl solder joints.