| Literature DB >> 28772561 |
Shouzhen Cao1, Shulong Xiao2, Yuyong Chen3,4, Lijuan Xu5, Xiaopeng Wang6, Jianchao Han7.
Abstract
In this study, an easily controlled transformation similar to the β + α → β + α + γ and the analysis of metastable phases in a β solidifying Ti-44.5Al-8Nb-2.5V alloy were investigated. Therefore, a liquid alloy copper-quenching followed by annealing at an application temperature (850 °C) has been carried out. Following quenching, a microstructure composed of several supersaturated phases-the basket-weave β₀ (βbv) phase, the plate-like α₂ (αp) phase and the stripe-like γ (γs) phase-was obtained. In the annealing processes, phase transformations in the prior βbv and αp phases domain corresponded nicely to the β + α → β + α + γ transformation during solidification. Also, in the annealed γs phase, the kinetics of the phase transformations involving the metastable L1₂ phase was firstly detected by transmission electron microscopy (TEM). The L1₂ phase had a lattice structure similar to the γ phase, whereas the composition of the phase was similar to the α₂ phase. The formation of the γ pre-twin phase with an anti-phase boundary (APB) was detected in the γs phase of the matrix. The orientation relationships between the γs and precipitated: γ (γp) phase are <101]γs//<114]γp, (10 1 ¯ )γs//( 1 ¯ 10)γp and (0 1 ¯ 0)γs//(22 1 ¯ )γp.Entities:
Keywords: L12 phase; low temperature phase transformation; titanium aluminides; γ pre-twin
Year: 2017 PMID: 28772561 PMCID: PMC5459198 DOI: 10.3390/ma10020201
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Back-scattered electron mode of the scanning electron microscope (SEM - BSE) images of the (a) as-cast and (b) copper-quenching microstructures of Ti-44.5Al-8Nb-2.5V alloy and (c,d) TEM images of the copper-quenching Ti-44.5Al-8Nb-2.5V microstructures.
Figure 2(a) Transmission electron microscopy (TEM); (b) selected area diffraction pattern (SADP) and (c) high-resolution transmission electron microscopy (HRTEM) images of the αm phase with stripes when annealed at 850 °C for 10 min. The red and yellow dots represent the stacking sequences of the γ phase (red dots) and precipitated stripes (yellow).
Figure 3(a) SEM—BSE and (b,c) TEM images of the microstructures annealed at 850 °C for 5 h; (d) SADPs of the white circle in (c) with B = <101]γs. The red rectangle in (d) represent the calibration of the γp phase and the green rectangle represent the calibration of the L12 phase.
Figure 4(a) Dark field and (b) scanning transmission electron microscope (STEM) area scan (step = 0.35 nm) images of the red square region in Figure 2c; (c) HRTEM images of the γs, L12 and γp phases with B = <101]γs. The red dots in (c) represent the HRTEM atomic configurations of the γs, L12 and γp phases.
Figure 5Supposed schematic models and schematic diffraction patterns of the (a,c) γ and (b,d) L12 phases.
Figure 6(a,b) TEM and HRTEM images of the γp phase with anti-phase boundaries (APBs) in the γs phase; (c) supposed schematic models of the 120° order fault domain with BD = [10]γ//[10]γT.