| Literature DB >> 28771994 |
Olivier Henrotte1, Thomas Bottein1, Hugo Casademont1, Kevin Jaouen1, Tiphaine Bourgeteau1, Stephane Campidelli1, Vincent Derycke1, Bruno Jousselme1, Renaud Cornut1.
Abstract
The amazing properties of 2D materials are envisioned to revolutionize several domains such as flexible electronics, electrocatalysis, or biosensing. Herein we introduce scanning electrochemical microscopy (SECM) as a tool to investigate molybdenum disulfide in a straightforward fashion, providing localized information regarding the electronic transport within chemical vapor deposition (CVD)-grown crystalline MoS2 single layers having micrometric sizes. Our investigations show that within flakes assemblies some flakes are well electrically interconnected, with no detectable contact resistance, whereas others are not electrically connected at all, independent of the size of the physical contact between them. Overall, the work shows how the complex electronic behavior of MoS2 flake assemblies (semiconducting nature, contact quality between flakes) can be investigated with SECM.Entities:
Keywords: chemical vapor deposition; electronic conduction; modelling; molybdenum disulfide; scanning electrochemical microscopy
Year: 2017 PMID: 28771994 DOI: 10.1002/cphc.201700343
Source DB: PubMed Journal: Chemphyschem ISSN: 1439-4235 Impact factor: 3.102