| Literature DB >> 28766046 |
Naoaki Onishi1, Kazuaki Kaitani2,3, Masashi Amano1, Sari Imamura1, Jiro Sakamoto1, Yodo Tamaki1, Soichiro Enomoto1, Makoto Miyake1, Toshihiro Tamura1, Hirokazu Kondo1, Chisato Izumi1, Yoshihisa Nakagawa1.
Abstract
Although very late recurrences (VLRs) (first recurrence >12 months after the last catheter ablation) of atrial fibrillation (AF) after multiple catheter ablation procedures are rare, it remains a critical issue. The risk factors for VLRs remain largely unclear. From December 2011 to April 2014, 253 patients underwent an initial catheter ablation. Of the 253 patients, 21 had AF recurrences within 1 year after the last catheter ablation. The study was conducted in the remaining 232 patients. Left ventricular diastolic dysfunction (LVDD) was assessed by echocardiography using composite categories with tissue Doppler imaging and left atrial volume measurements, i.e., a septal e' < 8 cm/s, lateral e' < 10 cm/s, and left atrium volume index (LAV/body surface area) (LAVI) ≥34 mL/m2. LVDD was observed in 40 patients. Sinus rhythm was preserved in 220 patients after multiple catheter procedures, and 12 had VLRs. The clinical factors possibly related to VLRs were examined, and a multivariate regression analysis showed that LVDD was the only independent risk factor for VLRs (hazard ratio: 10.31, 95% confidence interval: 2.78-38.18, P < 0.0001). LVDD at baseline is a risk factor for a VLR after multiple catheter ablation procedures for AF.Entities:
Keywords: Atrial fibrillation; Catheter ablation; Left ventricular diastolic dysfunction; Risk factor; Very late recurrence
Mesh:
Year: 2017 PMID: 28766046 DOI: 10.1007/s00380-017-1027-y
Source DB: PubMed Journal: Heart Vessels ISSN: 0910-8327 Impact factor: 2.037