| Literature DB >> 28731708 |
Jianqi Zhu1,2, Zhichang Wang3, Hua Yu1,2, Na Li1,2, Jing Zhang4, JianLing Meng5, Mengzhou Liao1,2, Jing Zhao6, Xiaobo Lu1,2, Luojun Du1, Rong Yang1,2, Dongxia Shi1,2, Ying Jiang3,7, Guangyu Zhang1,2,7,8.
Abstract
In this work, we report a facile, clean, controllable and scalable phase engineering technique for monolayer MoS2. We found that weak Ar-plasma bombardment can locally induce 2H→1T phase transition in monolayer MoS2 to form mosaic structures. These 2H→1T phase transitions are stabilized by point defects (single S-vacancies) and the sizes of induced 1T domains are typically a few nanometers, as revealed by scanning tunneling microscopy measurements. On the basis of a selected-area phase patterning process, we fabricated MoS2 FETs inducing 1T phase transition within the metal contact areas, which exhibit substantially improved device performances. Our results open up a new route for phase engineering in monolayer MoS2 and other transition metal dichalcogenide (TMD) materials.Entities:
Year: 2017 PMID: 28731708 DOI: 10.1021/jacs.7b05765
Source DB: PubMed Journal: J Am Chem Soc ISSN: 0002-7863 Impact factor: 15.419