| Literature DB >> 28546559 |
Tim Plath1, Christoph Lechner2, Velizar Miltchev3, Philipp Amstutz3, Nagitha Ekanayake4, Leslie Lamberto Lazzarino3, Theophilos Maltezopoulos3,5, Jörn Bödewadt2, Tim Laarmann2, Jörg Roßbach3.
Abstract
Free-electron lasers are unique sources of intense and ultra-short x-ray pulses that led to major scientific breakthroughs across disciplines from matter to materials and life sciences. The essential element of these devices are micrometer-sized electron bunches with high peak currents, low energy spread, and low emittance. Advanced FEL concepts such as seeded amplifiers rely on the capability of analyzing and controlling the electron beam properties with few-femtosecond time resolution. One major challenge is to extract tomographic slice parameters instead of projected electron beam properties. Here, we demonstrate that a radio-frequency deflector in combination with a dipole spectrometer not only allows for single-shot extraction of a seeded FEL pulse profile, but also provides information on the electron slice emittance and energy spread. The seeded FEL power profile can be directly related to the derived slice emittance as a function of intra-bunch coordinate with a resolution down to a few femtoseconds.Entities:
Year: 2017 PMID: 28546559 PMCID: PMC5445079 DOI: 10.1038/s41598-017-02184-3
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Schematic view of the sFLASH setup. The electron bunch traverses the beamline from left to right coming from the linear accelerator at a kinetic energy of 685 MeV. It is energy modulated at the seed laser wavelength 266 nm in the first long-period undulator. The subsequent chicane transforms the induced energy modulation into a current modulation. In the following undulator modules (radiator) these coherent structures initiate the FEL process at a harmonic of the seed laser wavelength. The electron bunches are characterized with an rf deflector followed by an energy spectrometer, which enables access to the longitudinal phase-space distribution by means of a diagnostic screen (right).
Experimental parameters.
| Parameter | Value |
|---|---|
| Electron beam energy | 685 MeV |
| Peak current | 0.62 kA |
| Seed laser wavelength | 266 nm |
| FEL wavelength | 38.1 nm |
| Active undulator length | 6.4 m |
| Chicane dispersive strength | 50 μm |
| Dimensionless Shear parameter of rf-deflector | 13.91 ± 0.22 |
Figure 2LPSD of an unseeded (a) and a seeded electron bunch (b) and the corresponding current profiles (c) and (d). The energy drop and energy spread increase of the electrons due to the FEL process can be seen in the right picture. In the subsequent plots, only the core region (white background) between −200 fs and +200 fs that supports FEL lasing will be shown.
Figure 3Reconstructed power profile from a typical seeded FEL pulse shown in Fig. 2b using the energy drop method. The blue dots show the reconstruction and the red curve shows a Gaussian fit with a peak power of P 0 = 429 MW. The shaded blue area shows the rms variation of the data derived from statistical errors of the reference bunches. The histogram inset shows the pulse length evaluation of 1979 shots of the present experimental campaign leading to τ = (78.0 ± 18.4) fs.
Figure 4The longitudinal phase space distribution of ultra-relativistic electron bunches for three different relative timings (−97 fs, −21 fs and 168 fs) between seed pulse and electron bunch are shown in panels (a–c). The panels (d–f) display the corresponding reconstructed power profiles. The two-dimensional histogram of panel g shows the correlation between seeded FEL peak power and the relative position of the seed laser pulse maximum in time. The histogram uses Gaussian smoothing with an rms size of 1 pixel. The white line indicates the seeded FEL performance predicted with the semi-analytical Ming-Xie formalism using electron beam parameters extracted with no FEL action at all. Panel h shows the measured energy spread from the unmodulated reference bunches and the reconstructed emittance used to calculate the prediction in panel g. The inset shows the longitudinal profile of the slice emittance in the core region of the bunch. It has its minimum at about −50 fs and increases towards the outer wings of the scan in agreement with the measured reduction of the emitted FEL power in these regions.