| Literature DB >> 28533523 |
Milena D'Angelo1,2,3, Aldo Mazzilli4, Francesco V Pepe5,6, Augusto Garuccio4,5,7, Vincenzo Tamma8,9,10.
Abstract
We present the experimental characterization of two distant double-slit masks illuminated by chaotic light, in the absence of first-order imaging and interference. The scheme exploits second-order interference of light propagating through two indistinguishable pairs of disjoint optical paths passing through the masks of interest. The proposed technique leads to a deeper understanding of biphoton interference and coherence, and opens the way to the development of novel schemes for retrieving information on the relative position and the spatial structure of distant objects, which is of interest in remote sensing, biomedical imaging, as well as monitoring of laser ablation, when first-order imaging and interference are not feasible.Entities:
Year: 2017 PMID: 28533523 PMCID: PMC5440408 DOI: 10.1038/s41598-017-02236-8
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Schematic representation of the experimental setup for sensing the transverse position and the spatial structure of two distant double-slit masks by second-order interference of chaotic light. See text for more details.
Figure 2Experimental demonstration of the sensitivity of second-order interference to the transverse position of a remote double-slits (T) whit respect to the other (C). The experimental results of the correlation measurement are obtained by scanning the mask T in the transverse plane, while keeping fixed both the mask C and the two detectors D and D . The (blue) circles, (yellow) stars and (red) triangles correspond to different positions of the fixed mask C. In particular, the stars and triangles are obtained after displacing mask C by and , respectively, with respect to its original position (circles). The (green) diamonds represent the normalized intensity measured by D while scanning mask T in the transverse plane; no interference effect appears at first order. Error bars are smaller than the point size for both first and second order data.
Figure 3Second-order interference measurement of the center-to-center separations d and d of the two remote double-slits masks C and T. (a) Experimental results of the normalized correlation measurement obtained by simultaneously scanning the transverse positions x and x of both detectors D and D , while keeping both masks fixed. From the fringe periodicity along each axis x (j = C, T) it is possible to retrieve the value of the center to center distance d characterizing the corresponding mask j. Moreover, the periodicity of the diagonal (solid red line) and anti-diagonal (dashed orange line) interference patterns provides the values of the difference d − d and the sum d + d of the center-to-center distances, respectively. The tilt of the equal-phase lines in the (x , x ) plane is determined by the ratio d /d of the center-to-center distances characterizing the two masks [see Eqs (9) and (10)]. (b) Normalized intensity measured by detector D while scanning the transverse plane x , when either laser light (blue circles) or chaotic light (green diamonds) illuminates the mask. (c) Normalized intensity measured by detector D while scanning the transverse plane x , when either laser light (blue circles) or chaotic light (green diamonds) illuminates the mask. Notice the absence of chaotic-light interference at first-order in both cases (b) and (c). Error bars are smaller than the point size for both sets of data.