Literature DB >> 28506559

A novel electron mirror pulse compressor.

M Mankos1, K Shadman2, B J Siwick3.   

Abstract

An electron mirror-based pulse compressor design has been developed for improving the temporal resolution of dynamic/ultrafast transmission electron microscopes and ultrafast electron diffraction cameras. The improvement will enable electron microscopes and diffraction cameras to better resolve the dynamics of reactions in the areas of solid state physics, chemistry, and biology. The design utilizes a combination of mirror optics and a magnetic beam separator, which exploits the symmetry inherent in reversing the electron trajectory in the mirror in order to compress the pulse. This system can also simultaneously correct the spherical and chromatic aberration of the objective lens for improved spatial resolution. For pulsed experiments with a practical bunch charge, the correction of the chromatic aberration coefficient counters the spread in the electron energies induced by the space charge of the pulse to make possible the probing of the sample with high spatial resolution. The pulse compressor can accommodate pulses with a range of electron densities and energy spreads. Furthermore, it is designed to fit into both ultrafast electron diffraction cameras and dynamic/ultrafast transmission electron microscopes. Consequently, this instrument is suitable for enhancing the study of the structure, composition, and bonding states of new materials at ultrafast time scales.
Copyright © 2017. Published by Elsevier B.V.

Keywords:  Aberration correction; Dynamic transmission electron microscopy; Electron mirror; Electron optics; Magnetic beam separator; Pulse compressor; Ultrafast electron diffraction

Year:  2017        PMID: 28506559     DOI: 10.1016/j.ultramic.2017.05.004

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  2 in total

1.  Solving the jitter problem in microwave compressed ultrafast electron diffraction instruments: Robust sub-50 fs cavity-laser phase stabilization.

Authors:  M R Otto; L P René de Cotret; M J Stern; B J Siwick
Journal:  Struct Dyn       Date:  2017-08-02       Impact factor: 2.920

Review 2.  Photoemission sources and beam blankers for ultrafast electron microscopy.

Authors:  Lixin Zhang; Jacob P Hoogenboom; Ben Cook; Pieter Kruit
Journal:  Struct Dyn       Date:  2019-09-27       Impact factor: 2.920

  2 in total

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