Literature DB >> 28492334

Solid-Liquid Interface Thermal Resistance Affects the Evaporation Rate of Droplets from a Surface: A Study of Perfluorohexane on Chromium Using Molecular Dynamics and Continuum Theory.

Haoxue Han1, Christiane Schlawitschek2, Naman Katyal3, Peter Stephan2, Tatiana Gambaryan-Roisman2, Frédéric Leroy1, Florian Müller-Plathe1,4.   

Abstract

We study the role of solid-liquid interface thermal resistance (Kapitza resistance) on the evaporation rate of droplets on a heated surface by using a multiscale combination of molecular dynamics (MD) simulations and analytical continuum theory. We parametrize the nonbonded interaction potential between perfluorohexane (C6F14) and a face-centered-cubic solid surface to reproduce the experimental wetting behavior of C6F14 on black chromium through the solid-liquid work of adhesion (quantity directly related to the wetting angle). The thermal conductances between C6F14 and (100) and (111) solid substrates are evaluated by a nonequilibrium molecular dynamics approach for a liquid pressure lower than 2 MPa. Finally, we examine the influence of the Kapitza resistance on evaporation of droplets in the vicinity of a three-phase contact line with continuum theory, where the thermal resistance of liquid layer is comparable with the Kapitza resistance. We determine the thermodynamic conditions under which the Kapitza resistance plays an important role in correctly predicting the evaporation heat flux.

Entities:  

Year:  2017        PMID: 28492334     DOI: 10.1021/acs.langmuir.7b01410

Source DB:  PubMed          Journal:  Langmuir        ISSN: 0743-7463            Impact factor:   3.882


  2 in total

Review 1.  Evaporation of liquid nanofilms: A minireview.

Authors:  Kaixuan Zhang; Wei Fang; Cunjing Lv; Xi-Qiao Feng
Journal:  Phys Fluids (1994)       Date:  2022-02-08       Impact factor: 3.521

2.  Thermal conductance between water and nm-thick WS2: extremely localized probing using nanosecond energy transport state-resolved Raman.

Authors:  Hamidreza Zobeiri; Nicholas Hunter; Ridong Wang; Xinman Liu; Hong Tan; Shen Xu; Xinwei Wang
Journal:  Nanoscale Adv       Date:  2020-11-02
  2 in total

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