Nikhil Parappurath1, Filippo Alpeggiani1,2, L Kuipers1,2, Ewold Verhagen1. 1. Center for Nanophotonics, AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands. 2. Kavli Institute of Nanoscience, Department of Quantum Nanoscience, Delft University of Technology, P.O. Box 5046, 2600 GA Delft, The Netherlands.
Abstract
We observe that the asymmetric transmission (AT) through photonic systems with a resonant chiral response is strongly related to the far-field properties of eigenmodes of the system. This understanding can be used to predict the AT for any resonant system from its complex eigenmodes. We find that the resonant chiral phenomenon of AT is related to, and is bounded by, the nonresonant scattering properties of the system. Using the principle of reciprocity, we determine a fundamental limit to the maximum AT possible for a single mode in any chiral resonator. We propose and follow a design route for a highly chiral dielectric photonic crystal structure that reaches this fundamental limit for AT.
We observe that the asymmetric transmission (AT) through photonic systems with a resonant chiral response is strongly related to the far-field properties of eigenmodes of the system. This understanding can be used to predict the AT for any resonant system from its complex eigenmodes. We find that the resonant chiral phenomenon of AT is related to, and is bounded by, the nonresonant scattering properties of the system. Using the principle of reciprocity, we determine a fundamental limit to the maximum AT possible for a single mode in any chiral resonator. We propose and follow a design route for a highly chiral dielectric photonic crystal structure that reaches this fundamental limit for AT.
A strong
chiral response is
essential for realizing devices that can manipulate the polarization
of light. Natural chiral materials rely on bulk properties including
birefringence and result in thick and bulky devices for polarization
control. Much stronger chirality can be realized by exploiting the
interaction of light with artificial nanostructures.[1−3] Such interactions are observed to be enhanced through local resonances
such as those supported by plasmonic antennas,[4,5] periodically
structured dielectric waveguides,[6] etc.
Arrangements of subwavelength-sized optical scatterers, called metasurfaces,
are known for their exotic light-steering properties and polarization-dependent
response.[7,8] A better understanding of light–matter
interaction at the nanoscale will help us to realize optical metasurfaces
with designable vectorial near and far electromagnetic fields. Polarization-manipulating
nanostructures are also important for realizing compact and/or on-chip
polarization rotators, wave plates, and polarizing beam splitters.[9−13]An extreme possible consequence of the chirality of a system
is
asymmetric transmission (AT), the difference in total transmittance
when light with a certain polarization impinges from opposite sides
of the system.[14] While it is possible to
realize systems that radiate asymmetrically in opposite directions
by breaking mirror symmetry in the propagation direction,[15] AT however requires a strongly chiral response.Notably, when an emitter is placed in asymmetrically transmitting
systems, this strong chirality also implies a significant difference
between the polarizations of the emitted light in opposite sides of
the system. Realization of AT in nanostructures thus relates directly
to potential functionalities such as polarization control of spontaneous
emission,[16] spin-dependent light emission,[17,18] and enantioselective sensing.[19] There
has been a considerable number of experimental attempts at realizing
strong chirality in nanostructures. Several of these have been shown
to offer AT for circularly polarized light using both metallic[20−23] and dielectric[24,25] structures. However, to realize
AT for linearly polarized light is significantly more challenging,
as it strictly requires broken mirror symmetry in the propagation
direction.[26] So far, attempts at realizing
AT for linearly polarized light have been restricted mainly to metallic
structures.[27−31] Important open questions remain, such as how to introduce an efficient
symmetry breaking, what is the maximum AT that can be achieved, and
how to design structures that can offer this maximum AT.In
this work, we investigate in detail the AT for linearly polarized
light in dielectric chiral resonators. We show that the quasinormal
modes of the system can be used to predict the AT for any system.
We develop a theoretical formalism to find structures that can offer
very high AT. Comparing full-field simulations to original theory,
the origin and limits of AT are explored in terms of the properties
of the quasinormal modes of the system. We uncover an important relation
between the AT, which is a resonant phenomenon, and the direct reflectivity,
which is a nonresonant property of the system. This relation, derived
from the principle of reciprocity, creates a fundamental limit for
AT in any chiral resonator. Following an optimization strategy to
conform to this result, an example design for a photonic crystal structure
with subwavelength thickness that can offer AT as high as 84% is proposed.
On
the Origin of AT in Resonant Systems
Figure illustrates
the concept of AT in chiral systems. Linearly polarized light is normally
incident on the system in the forward direction (top-to-bottom direction
in the figure). In the figure, the polarization of the incident beam
is ŝ. Let the orthogonal
polarization component be called ŝ. The transmitted electric field of light can, in principle,
contain both components. For ŝ-polarized incident light with electric field E1inc, the complex
forward transmission coefficients corresponding to the two electric
field components along ŝ and ŝ in the transmitted
light can be defined as t11f = (ŝ·Etran)/E1inc and t21f = (ŝ·Etran)/E1inc, where Etran is
the total transmitted electric field. The respective transmittances,
ratios of the transmitted intensities and the incident intensity,
are then T11f = |t11f|2 and T21f = |t21f|2. The total transmittance in the forward direction for ŝ-polarized incidence can
then be expressed as T1f = T11f + T21f. Similarly, when ŝ-polarized light is incident
from the opposite side of the structure, the total transmittance in
the backward direction can be written as T1b = T11b + T21b. AT is the difference in the total transmittances in the two directions
for polarized light and can be represented as AT = |T1f – T1b|. It has been shown[26,31] that for reciprocal materials
AT is equivalent to the difference between cross-polarization conversion
between two orthogonally polarized incidences. Thus, we can also write
AT as the difference in the orthogonal transmittances for two mutually
perpendicular polarized incidences in a given direction. i.e.,where Tf = |(ŝ·Etran)/Einc|2.
Figure 1
Concept of AT: Linearly
polarized (ŝ-polarized)
light is incident from the opposite sides
of a chiral photonic system. T11 and T21 are the transmittances of the electric field
component parallel and orthogonal to ŝ, respectively. AT is the difference between the total
transmittances in the two directions.
Concept of AT: Linearly
polarized (ŝ-polarized)
light is incident from the opposite sides
of a chiral photonic system. T11 and T21 are the transmittances of the electric field
component parallel and orthogonal to ŝ, respectively. AT is the difference between the total
transmittances in the two directions.In the following, we probe the origin of AT in chiral systems.
Even though our conclusions and methodology apply to any general photonic
systems, we will now illustrate them with a specific example, a dielectric
bilayer photonic crystal slab. We consider light that propagates perpendicular
to the plane in which the structure is periodic. A unit cell of the
2-D periodic structure is shown in the inset of Figure b. It is composed of two rectangular air
holes stacked in mutually perpendicular fashion in a high-index (n = 3.48) material. The orthogonal arrangement of holes
breaks mirror symmetry in the propagation direction (z-axis in the inset). Here, without loss of any generality, we choose ŝ and ŝ along the geometrical x- and y-axes, respectively. Finite element method
(FEM) simulations[32] are used to calculate
various transmittances T, T, T, and T of the structure in a given frequency range. In Figure a, T and T (violet and orange dashed lines, respectively)
are the simulated parallel and orthogonal transmittances for x-polarized incident field. T and T (red and olive dashed lines) denote the simulated orthogonal and
parallel transmittances, respectively, for y-polarized
incident field. The parallel transmittance for both incident polarizations, T and T, coincides over the entire frequency range.
However, there is a significant difference between the spectra of
orthogonal transmittances T and T at certain
frequencies. The AT spectrum for x (or y) polarized incident light is calculated from the simulation results
using eq and shown
as a dashed blue line in Figure b.
Figure 2
Transmission spectra: Various transmittances (a) and AT
(b) as
a function of frequency of the linearly polarized (x- or y-polarized) incident light in the positive z direction. T, T, T, T, and AT are shown as violet, orange, olive, red, and dark
blue, respectively. Thick dashed lines correspond to the FEM simulation
data, and solid lines except gray and cyan feature transmittances
predicted by our theoretical formalism. Gray and cyan lines represent
the calculated background reflectance and transmittance, respectively,
for an effective uniform slab (see the text in section
3). Green triangles represent the calculated real parts of
the eigenfrequencies of the structure for zero parallel wave vector.
The inset in panel b shows a unit cell of the proposed structure.
Transmission spectra: Various transmittances (a) and AT
(b) as
a function of frequency of the linearly polarized (x- or y-polarized) incident light in the positive z direction. T, T, T, T, and AT are shown as violet, orange, olive, red, and dark
blue, respectively. Thick dashed lines correspond to the FEM simulation
data, and solid lines except gray and cyan feature transmittances
predicted by our theoretical formalism. Gray and cyan lines represent
the calculated background reflectance and transmittance, respectively,
for an effective uniform slab (see the text in section
3). Green triangles represent the calculated real parts of
the eigenfrequencies of the structure for zero parallel wave vector.
The inset in panel b shows a unit cell of the proposed structure.As evident from the figure, the
AT has pronounced features around
certain frequencies. The resonant nature of this chiral response hints
at a connection between the response and resonant modes of the structure.
The parallel component of the momentum is zero for light at normal
incidence. Due to parallel momentum conservation, a normally incident
wave would only excite modes with a wave vector having zero parallel
component (i.e., k∥ = 0, which
corresponds to the Γ point in momentum space). Using a commercial
FEM mode solver,[32] we calculate the eigenfrequencies
(green triangles in Figure b) of the structure for a parallel wavevector of zero. These
simulations reveal that the resonances in the AT spectrum indeed coincide
with the real parts of the eigenfrequencies of the structure, indicating
a strong relation between the AT and the complex-frequency modes of
the structure. With this understanding of the origin of AT, we now
develop a theoretical formalism to predict AT from the properties
of these eigenmodes.
Predicting AT from the Quasinormal Modes
of a System
To qualitatively predict AT, we follow a general
approach and develop
a theoretical formalism based on coupled-mode theory. The theory explores
the relation among incoming waves, outgoing waves, and guided modes
in any chiral resonator.Consider an open optical system having
a set of quasinormal modes
as shown in Figure . The modes interact with incoming and outgoing plane waves above
and below the system. The two orthogonal polarizations ŝ and ŝ characterize the electric fields of these waves. Four ports,
1U, 2U, 1L and 2L, carrying incoming and outgoing electromagnetic
waves, are used to represent these two polarizations above and below
the system. The ports 1U and 2U respectively depict the polarizations ŝ and ŝ of the incoming or outgoing waves above
the structure. Similarly, the ports 1L and 2L depict the polarizations ŝ and ŝ of the waves below the structure.
Figure 3
Coupled-mode-theory-based
concept of eigenmodes’ interaction
with incoming/outgoing waves. Four ports, 1U, 2U, 1L, and 2L, represent
incoming and outgoing electromagnetic plane waves of the two polarizations ŝ and ŝ. Scattering eigenvector b mediates
the interaction of resonances (ω̃) with these ports. Waves
can also couple directly (C) through reflection and
transmission coefficients r and t. See the text for a detailed description.
Coupled-mode-theory-based
concept of eigenmodes’ interaction
with incoming/outgoing waves. Four ports, 1U, 2U, 1L, and 2L, represent
incoming and outgoing electromagnetic plane waves of the two polarizations ŝ and ŝ. Scattering eigenvector b mediates
the interaction of resonances (ω̃) with these ports. Waves
can also couple directly (C) through reflection and
transmission coefficients r and t. See the text for a detailed description.Mathematically, the incoming and outgoing waves of any system
are
related to each other by the system’s scattering matrix containing
frequency-dependent transmission and reflection coefficients. The
total scattering matrix of the system can be written as the sum of
two scattering matrices featuring the two types of interaction between
the incoming and outgoing waves: (i) the resonance-assisted interaction
(denoted by the ω̃ channel in Figure ), where the waves couple through the resonant
modes of the structure, and (ii) the nonresonant interaction (denoted
by C in the figure), where the waves couple directly
through a nonresonant background process.The resonant interaction,
as illustrated in the figure, is related
to the mode’s radiated electric field values at ports 1U, 2U,
1L, and 2L, which can be described by a scattering eigenvector b = [bbbb] containing
the far-field components of quasinormal modes at each port. We characterize
the nonresonant coupling by the frequency-dependent direct-process
scattering matrix[33]C,
which has a nonchiral and polarization-independent response asC must be unitary and symmetric[34] for reciprocal materials. The frequency-dependent
coefficients r and t are the direct
reflection and transmission coefficients, respectively (the arbitrary
phase factor of this matrix, which depends on the choice of the positions
of our reference ports,[35] can be omitted
without any loss of generality, and we can suppose r and t to be positive real amplitudes such that r2 + t2 = 1).As we have recently shown,[36] building
upon ref (34), it is
possible to obtain the complete scattering matrix for any photonic
system from the far-field properties of its eigenmodes. For a system
with a set of complex eigenfrequencies ω̃(j = 1, ..., m),
the scattering matrix can be written aswhere a is a complex coefficient
that can be calculated for a unitary and symmetric scattering matrix
by imposing time-reversal symmetry and reciprocity conditions. The
general expression for coefficient a is discussed
in detail in ref (36).For our structure, the nonresonant reflection and transmission
coefficients in eq can
be obtained by fitting[37] the background
response of the numerical simulation data to the response of a slab-like
structure with an effective homogeneous permittivity and thickness.
The calculated slowly varying transmission and reflection intensities T = t2 and R = r2 are shown as cyan and gray solid
lines, respectively, in Figure . Using eq ,
we predict various transmittances T, T, T, and T as well as the AT for the example structure.
The predicted quantities are represented by solid lines in Figure a and b and correspond
very well with the simulation data.Since we are able to predict
the AT for the structure only from
the complex frequencies and the far-field properties of the eigenmodes
of the structure, it is now clear that AT is a resonant phenomenon
that completely depends on the far-field characteristics. So, by tuning
the mode properties, we can enhance the AT offered by the structure.
It is instructive to study what the maximum AT is that can be achieved
in any structure and how to design structures that can reach such
a limit.
On the Limit of AT
Dependence of the AT on the far-field
properties of the eigenmodes
stems from the interaction of the incoming and outgoing waves with
the scattering eigenvector b of the modes. The eigenvector b can be normalized arbitrarily, as the scattering matrix
(eq ) is independent
of such normalization, absorbing it in the evaluation of the coefficient a.[36] Thus, for each mode, b basically comprises a set of
field values (b1U, b2U, b1L, and b2L). The field values b1U and b2U represent the two components of eigenmode
polarization above the structure, and b1L and b2L represent the two eigenmode
polarization components below the structure in the far field. For
the example structure, the eigenmode field polarizations above and
below the structure are related to each other by certain symmetry
properties. The symmetry in the chosen structure is such that it returns
to the original configuration after a series of operations: (i) an
inversion along z, (ii) an inversion along x, and (iii) a clockwise rotation of 90° (see the SI for details). This symmetry dictates that
the eigenvectors of the system must satisfy the following relation
among the polarization components of the eigenmode field below the
structure and the polarization components above the structure:Inspection of calculated
eigenfields from
the FEM simulation confirms these relationships. In the range of frequencies
we plot in Figure , it can be observed that the highest AT occurs around an isolated
mode at ω0/2π = 364 THz. We can represent the
far-field polarization (b1U, b2U) of the eigenmode in terms of a set of normalized Stokes
parameters S1, S2, and S3.[38]Expressing b in terms of the polarization parameters
and applying eqs and 3, we get an equation for the AT provided by a single
mode in terms of its polarization parameters (as elaborated in the SI). We find that, at the eigenfrequency, the
peak value of AT and the polarization parameters of the eigenmode
have a direct relation:where S1 is the
first normalized Stokes parameter. This very simple, yet powerful
relation holds a huge potential for obtaining the maximum possible
AT by parametric optimization of any structure. A chosen structural
parameter can be swept while tracking the isolated modes, and the
calculated S1 can predict the AT for each
case. To illustrate this, we vary a single parameter, the total thickness
of the chiral photonic crystal, and depict the predicted AT for the
considered isolated eigenmode, as a function of the thickness. The
blue circles in Figure a represent the theoretically predicted AT (the Stokes parameter S1) for different thicknesses. The transmission
simulation results are shown alongside (as black circles) to verify
the prediction. The minor differences between the predicted and calculated
values could be due to a small uncertainty in determining the far
field of eigenmodes or a small contribution of a relatively distant
mode. It can be seen that the optimum thickness is 0.5a, where a is the periodicity of the structure. In
fact, the structure we present in Figure is the optimized case. It is to be noted
that the maximum AT offered by the structure is 84%, which is less
than unity.
Figure 4
Parameter optimization and the fundamental limit of AT for a single
mode of the proposed structure. (a) Predicted ATs for an isolated
single mode for different thicknesses of the structure are shown as
blue circles. Corresponding simulation results are shown as black
small circles. (b) Calculated AT (blue solid line) and fundamental
limit of maximum AT (red solid line) for a single mode together with
FEM simulation data (blue data points).
Parameter optimization and the fundamental limit of AT for a single
mode of the proposed structure. (a) Predicted ATs for an isolated
single mode for different thicknesses of the structure are shown as
blue circles. Corresponding simulation results are shown as black
small circles. (b) Calculated AT (blue solid line) and fundamental
limit of maximum AT (red solid line) for a single mode together with
FEM simulation data (blue data points).According to eq ,
we would attain unity AT when |S1| = 1,
i.e., when the eigenmode of the structure is completely linearly polarized
along one of the x and y Cartesian
axes of the structure. However, we find that the polarization parameters
of the mode are restricted such that it is not always possible to
get a mode that is completely linearly polarized in the far field.
This constraint arises from the principle of reciprocity, which relates
the polarization parameters of the resonant mode to the nonresonant
scattering properties of the structure. In the following, we show
how the principle of reciprocity puts a fundamental limit on the possible
polarization parameters for a mode, and hence the AT.Following
ref (34), the principle
of reciprocity in coupled-mode theory can be expressed
for a single mode aswhere the total phase factor ξ subsumes
the arbitrary phase factors in the definition of C and in the normalization of b (see Section 2 in the SI). Expressing eq in terms of the components r and t that make up C and the polarization parameters
from the normalized b (as detailed in the SI), we obtain that eq implies the relationwhich indicates that the
ratio between the
Stokes parameters S3 and S1 of the eigenmode is related to the nonresonant background
transmission of the structure at the mode frequency. This is extremely
interesting, because it shows that a mode can be linearly polarized
(|S3| = 0, |S1| = 1) only if the corresponding nonresonant transmission coefficient t is zero. Realistically, the background transmission from
a homogeneous effective dielectric slab can never go to zero. Consequently,
the modes of the system are generally constrained to be elliptically
polarized.We use eq to derive
the fundamental constraint on the AT for the structure. The relation S12 + S32 ≤ 1, which follows directly from the normalization
of Stokes parameters, then implies , and from eq we obtainwhere R = r2 is the nonresonant reflectivity
of the structure. It
is interesting to note that AT, which is the difference between two
resonant transmission intensities, has a limit that is given by the
nonresonant reflection amplitude. For practical applications that
require maximum AT, it is thus important to engineer maximum nonresonant R at the operation wavelength.We choose the mode
(ω0/2π = 364 THz) having
the highest AT from the FEM simulation data and calculate the fundamental
limit for the maximum AT around the mode. The data points in Figure b shows the FEM simulation-based
AT as a function of the frequency of the normally incident light.
The calculated fundamental limit, r, is shown as
the red solid line. It can be seen that the theoretically calculated
AT (blue solid line) as well as the FEM simulation data are very close
to the fundamental limit.The discussion so far in this section
has been limited to the particular
structure we proposed as an example. The specific symmetry properties
of the structure were used to derive the results stated above. It
is therefore important to verify the universality of the results on
the limit of AT. In the following, we seek a fundamental limit for
the AT offered by any single-mode resonator regardless of its symmetry
properties and find that the result stays the same for the general
case as well.For deriving the limits for a general structure,
we are no longer
allowed to use the relation given by eq , as it was derived from the specific symmetry properties
of the example. Equation , which is based on the principle of reciprocity, is still valid
and can be used to relate below-the-structure polarization parameters
to the polarization parameters above the structure. Using this new
relation in eq leads
to a general expression for AT in terms of the polarization parameters S1 and S3, the phase
factor ξ, and the coefficients r and t:where is the phase difference between the orthogonal
polarization components of the eigenmode field above the structure.
Please note that r and t are positive
real coefficients here as a result of our convention for the arbitrary
port phases such that C takes the form of eq . In the most general case,
they thus represent the absolute value of the nonresonant reflection
and transmission coefficients, respectively (see the SI for detailed derivation). The local maximum of this equation
can be found from an analysis of its first-order derivatives and corresponds
to the condition |S1| = r, |S3| = t, and . The corresponding value of AT at the maximum
is ATmax = r = √R. As we will now show, this maximum is a global maximum, which means
that the nonresonant reflectivity puts the same fundamental limit
for the AT in any single-mode resonator irrespective of its structural
symmetry.Using eq , we calculate
AT for an isolated mode for 100 000 randomly chosen points
in the polarization space, i.e., random S1, ϕ, and ξ. The calculated AT is plotted in Figure as a function of
reflection coefficient r. It can be observed that
all the values are below or at the predicted fundamental limit, r. It must also be noted that most of the random polarizations
exhibit an AT significantly lower than the fundamental limit. Only
very few combinations of polarization parameters can produce an AT
close to the fundamental limit.
Figure 5
Fundamental limit of AT: Scatterplot of
AT vs the nonresonant reflection
coefficient r for 100 000 random eigenmode
polarizations in a structure without any specific symmetry properties.
Solid red line corresponds to AT = r.
Fundamental limit of AT: Scatterplot of
AT vs the nonresonant reflection
coefficient r for 100 000 random eigenmode
polarizations in a structure without any specific symmetry properties.
Solid red line corresponds to AT = r.As we have shown using eq and Figure a earlier in this section, with an educated choice
of structural
symmetry and a proper optimization of structural parameters, we can
now design structures that offer an AT near the fundamental limits.
The structure shown as an example in the beginning of this paper would
be an excellent candidate for realizing high AT with a fully dielectric
structure.
Discussion and Conclusions
The basis for the outlined
theoretical results is coupled-mode
theory, which allows extending these results to any general resonator
system. The discussed examples used for deriving the limits are dielectric
2-D periodic structures. For metallic or lossy systems including systems
with more than two input/output channels, the expression for the scattering
matrix and the subsequent equations for AT and its limits can easily
be rederived considering the nonradiative decay rates of the modes.[36] It must be noted that it is possible to use
the coupled-mode theory for describing the scattering properties of
arbitrary-shaped particles.[39] This allows
us to extend our formalism to such particles as well.The presented
simulation results consider a 2-D infinitely extended
periodic structure and transmission of normally incident light. We
note that AT for such a geometry is expected to vary as a function
of the angle of incidence due to the Bloch eigenmode’s dispersion.
A finite numerical aperture (NA) of the experimental setup should
be taken into account for experimental realization of the results,
as we do for our example system in the SI.In conclusion, we showed that the AT in chiral resonators
depends
strongly on the far-field properties of their eigenmodes. We developed
a theoretical formalism that can predict AT offered by any system
from its complex eigenmodes. We investigated the theoretical maximization
of AT in chiral resonators. A fundamental limit for AT provided by
a single mode is presented. We also proposed the design for a chiral
photonic crystal that can offer AT as high as the fundamental limit,
which is the nonresonant reflection amplitude of the system. The theoretical
formalism presented here opens ways for designing and optimizing new
structures for light manipulation.