Literature DB >> 28460267

Development of compact Cs corrector for desktop electron microscope.

Wei-Yu Chang1, Fu-Rong Chen2.   

Abstract

The desktop Electron Microscopes (desktop EMs) have been commercialized in the recent years, offering a spatial resolution around 1nm in scanning-transmission mode in a routine operation. For the purpose of further improvement in spatial resolution and signal / noise, one may need an aberration corrector with a compact form in order to fit into a desktop EM. In this paper, the permanent magnets with tunable coil are implemented as a transfer lens doublet to realize a compact hexapole corrector for a desktop EM. It will be shown that, with a proper design of permanent magnet transfer lens doublet and hexapole lens, we can generate a negative Cs and avoid the second-order axial astigmatism to reduce the final spot size at the sample plane to be better than 0.5nm for a field emission source. To fulfill with the required condition of a hexapole corrector, a tunable lens is implemented to adjust the magnetic field for compensating the practical error from the permanent magnet.
Copyright © 2017 Elsevier B.V. All rights reserved.

Entities:  

Year:  2017        PMID: 28460267     DOI: 10.1016/j.ultramic.2017.04.009

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  1 in total

1.  Aberration correction for low voltage optimized transmission electron microscopy.

Authors:  Jaromír Bačovský
Journal:  MethodsX       Date:  2018-08-25
  1 in total

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