Literature DB >> 28452517

Direct Measurement of Sub-10 fs Relativistic Electron Beams with Ultralow Emittance.

Jared Maxson1, David Cesar1, Giacomo Calmasini1, Alexander Ody1, Pietro Musumeci1, David Alesini2.   

Abstract

Ultralow emittance (≤20  nm, normalized) electron beams with 10^{5} electrons per bunch are obtained by tightly focusing an ultrafast (∼100  fs) laser pulse on the cathode of a 1.6 cell radio frequency photoinjector. Taking advantage of the small initial longitudinal emittance, a downstream velocity bunching cavity is used to compress the beam to <10  fs rms bunch length. The measurement is performed using a thick high-voltage deflecting cavity which is shown to be well suited to measure ultrashort durations of bunching beams, provided that the beam reaches a ballistic longitudinal focus at the cavity center.

Year:  2017        PMID: 28452517     DOI: 10.1103/PhysRevLett.118.154802

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  14 in total

1.  Solving the jitter problem in microwave compressed ultrafast electron diffraction instruments: Robust sub-50 fs cavity-laser phase stabilization.

Authors:  M R Otto; L P René de Cotret; M J Stern; B J Siwick
Journal:  Struct Dyn       Date:  2017-08-02       Impact factor: 2.920

2.  Double-shot MeV electron diffraction and microscopy.

Authors:  P Musumeci; D Cesar; J Maxson
Journal:  Struct Dyn       Date:  2017-05-19       Impact factor: 2.920

3.  Outrunning damage: Electrons vs X-rays-timescales and mechanisms.

Authors:  John C H Spence
Journal:  Struct Dyn       Date:  2017-06-01       Impact factor: 2.920

4.  Robust reconstruction of time-resolved diffraction from ultrafast streak cameras.

Authors:  Daniel S Badali; R J Dwayne Miller
Journal:  Struct Dyn       Date:  2017-06-02       Impact factor: 2.920

5.  Segmented Terahertz Electron Accelerator and Manipulator (STEAM).

Authors:  Dongfang Zhang; Arya Fallahi; Michael Hemmer; Xiaojun Wu; Moein Fakhari; Yi Hua; Huseyin Cankaya; Anne-Laure Calendron; Luis E Zapata; Nicholas H Matlis; Franz X Kärtner
Journal:  Nat Photonics       Date:  2018-04-02       Impact factor: 38.771

6.  Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities.

Authors:  W Verhoeven; J F M van Rens; W F Toonen; E R Kieft; P H A Mutsaers; O J Luiten
Journal:  Struct Dyn       Date:  2018-10-12       Impact factor: 2.920

7.  Active control of bright electron beams with RF optics for femtosecond microscopy.

Authors:  J Williams; F Zhou; T Sun; Z Tao; K Chang; K Makino; M Berz; P M Duxbury; C-Y Ruan
Journal:  Struct Dyn       Date:  2017-08-21       Impact factor: 2.920

8.  Enhancing particle bunch-length measurements based on Radio Frequency Deflector by the use of focusing elements.

Authors:  Pasquale Arpaia; Roberto Corsini; Antonio Gilardi; Andrea Mostacci; Luca Sabato; Kyrre N Sjobak
Journal:  Sci Rep       Date:  2020-07-10       Impact factor: 4.379

9.  Electron energy analysis by phase-space shaping with THz field cycles.

Authors:  Dominik Ehberger; Catherine Kealhofer; Peter Baum
Journal:  Struct Dyn       Date:  2018-08-29       Impact factor: 2.920

10.  Simulation studies for characterizing ultrashort bunches using novel polarizable X-band transverse deflection structures.

Authors:  Daniel Marx; Ralph W Assmann; Paolo Craievich; Klaus Floettmann; Alexej Grudiev; Barbara Marchetti
Journal:  Sci Rep       Date:  2019-12-27       Impact factor: 4.379

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