| Literature DB >> 28401945 |
Richard L Taylor1, Christopher D B Bentley1, Julen S Pedernales2, Lucas Lamata2, Enrique Solano2,3, André R R Carvalho1,4, Joseph J Hope1.
Abstract
Large-scale digital quantum simulations require thousands of fundamental entangling gates to construct the simulated dynamics. Despite success in a variety of small-scale simulations, quantum information processing platforms have hitherto failed to demonstrate the combination of precise control and scalability required to systematically outmatch classical simulators. We analyse how fast gates could enable trapped-ion quantum processors to achieve the requisite scalability to outperform classical computers without error correction. We analyze the performance of a large-scale digital simulator, and find that fidelity of around 70% is realizable for π-pulse infidelities below 10-5 in traps subject to realistic rates of heating and dephasing. This scalability relies on fast gates: entangling gates faster than the trap period.Entities:
Year: 2017 PMID: 28401945 PMCID: PMC5388870 DOI: 10.1038/srep46197
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Plots of (a) error and (b) total time taken for fast-gate-based algorithms implementing the UMQ unitary (Equation 3). n represents the number of π-pulse pairs used for each momentum kick in the fast gates. The initial motional state is a thermal state with average occupation for each mode. The red triangles in (a) represent a target gate fidelity to achieve a total simulation fidelity of 70%, and in (b) represent the target time for a single UMQ gate to prevent significant trap heating effects during a simulation, given a heating rate of 10 s−1. The purple triangles in (b) are an estimate of the gate time for a Mølmer-Sørensen gate, assuming a two-qubit gate time of 50 μs.
Figure 2Gate times for FRAG fast gates on a two-ion trap with varying n.
The points represent the numerical solutions for each n, and the dashed line is a least-squares fit to the points with the equation T = 1.149 μs × n−0.6704, where T is gate time.
Figure 3A plot of infidelity for (a) a two-qubit n = 50 fast gate and (b) a full UMQ gate against the rotational infidelity in each π pulse, F. The error in (b) is estimated assuming the errors in successive fast gates are uncorrelated, and the dashed line represents a threshold per-gate error to achieve 70% fidelity for the full simulation.
Figure 4Infidelity of an n = 2 two-qubit fast gate in a two-ion trap under (a) trap heating and (b) dephasing.