| Literature DB >> 28400586 |
Cong Son Ho1, Yi Wang2, Zhou Bin Siu2, Seng Ghee Tan3, Mansoor B A Jalil2, Hyunsoo Yang2.
Abstract
We investigate the thickness optimization for maximum current-induced spin-orbit torque (SOT) generated by topological surface states (TSS's) in a bilayer system comprising of a ferromagnetic layer coupled to a thin topological insulator (TI) film. We show that by reducing the TI thickness, two competing effects on the SOT are induced: (i) the torque strength is stronger as the bulk contribution is decreased; (ii) on the other hand, the torque strength becomes suppressed due to increasing hybridization of the surface states. The latter is attributed to the opposite helicities of the coupled TSS's. We theoretically model the interplay of these two effects and derive the optimal TI thickness to maximize the spin torque, which is estimated to be about 3-5 nm for typical Bi2Se3 films.Entities:
Year: 2017 PMID: 28400586 PMCID: PMC5429793 DOI: 10.1038/s41598-017-00911-4
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Schematic diagram of bilayer ferromagnet/topological insulator. The TI film is of the thickness d. (b) Schematic energy versus k subbands near the Dirac points (k = 0) for various values of the tunneling element Δ. (c) Schematic diagram of the current distribution in the bilayer with j being the current in the TI film, and being the shunting current through the FM layer. In the TI film, the current can flow in the surface state channel and bulk channel , respectively.
Figure 2(a,b) Spin torque efficiency induced by topological surface states (TSS) in an ideal TI in the absence of the bulk channel. (a) Spin torque as a function of the tunneling coupling Δ. (b) Spin torque as a function of thickness d, J ex = 0.2 eV. (c,d) Spin torque efficiency induced by TSS in the presence of the bulk channel. (c) Torque efficiency as a function of thickness. Comparing to the efficiency in thick film limit (θ 0 normalized to 1), the maximum efficiency is about 3.5 times larger at an optimal thickness . Parameters used: J ex = 0.2eV, . (d) The value of optimal thickness as a function of exchange coupling for various TI parameter B 1. The horizontal dashed line represents the effective thickness of the TI surface states (~2 nm). The peak of torque efficiency is only observed if the value of d max is above the dashed line. θ 0 is the efficiency at the limit of thick TI film. Parameters used: B 1 = 0.1eV nm2 [21].