| Literature DB >> 28358135 |
Zhiwei Fang1,2,3, Yingxin Xu4, Min Wang1,2, Lingling Qiao1, Jintian Lin1, Wei Fang4, Ya Cheng1,5,6.
Abstract
We demonstrated integrating a high quality factor lithium niobate microdisk resonator with a free-standing membrane waveguide. Our technique is based on femtosecond laser direct writing which produces the pre-structure, followed by focused ion beam milling which reduces the surface roughness of sidewall of the fabricated structure to nanometer scale. Efficient light coupling between the integrated waveguide and microdisk was achieved, and the quality factor of the microresonator was measured as high as 1.67 × 105.Entities:
Year: 2017 PMID: 28358135 PMCID: PMC5372359 DOI: 10.1038/srep45610
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1The processing flow of fabricating an on-chip LN microresonator integrated with a waveguide is illustrated.
(a,b) Formation of LN microresonator with the integrated waveguide using femtosecond laser microfabrication. (c,d) Focused ion beam (FIB) milling to smooth the periphery of the structure fabricated by femtosecond laser direct writing as shown in (b). (e,f) Chemical wet etching of the sample undergone the FIB milling to form the freestanding LN microdisk resonator and waveguide.
Figure 2(a) Top view optical micrograph of the entire integrated device. (b) Close-up view optical micrograph of the microdisk coupled with the waveguide. (c) SEM image of the LN microdisk coupled to the LN waveguide and (d) closed-up view of the coupling area with the gap between the LN microdisk and waveguide of 162.5 nm width.
Figure 3(a) Normalized transmission spectrum of the integrated device. (b) The Lorentzian fitting shows a Q-factor of 1.67 × 105.
Figure 4(a) Illustration of the model structure used in the simulation. (b) Normalized transmission spectrum of the integrated device for an input TE beam.