| Literature DB >> 28340521 |
Bitao Liu1,2, Hengqing Yan3, Shanyong Chen3, Youwei Guan3, Guoguo Wu4, Rong Jin3, Lu Li5.
Abstract
Silver nanowires without particles are synthesized by a solvothermal method at temperature 150 °C. Silver nanowires are prepared via a reducing agent of glycerol and a capping agent of polyvinylpyrrolidone (M w ≈ 1,300,000). Both of them can improve the purity of the as-prepared silver nanowires. With controllable shapes and sizes, silver nanowires are grown continuously up to 10-20 μm in length with 40-50 nm in diameter. To improve the yield of silver nanowires, the different concentrations of AgNO3 synthesis silver nanowires are discussed. The characterizations of the synthesized silver nanowires are analyzed by UV-visible absorption spectroscopy, X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscope (AFM), and silver nanowires are pumped on the cellulose membrane and heated stress on the PET. Then, the cellulose membrane is dissolved by the steam of acetone to prepare flexible transparent conducting thin film, which is detected 89.9 of transmittance and 58 Ω/□. Additionally, there is a close loop connected by the thin film, a blue LED, a pair of batteries, and a number of wires, to determinate directly the film if conductive or not.Entities:
Keywords: Conductive; Silver nanowires; Transmittance; Without particles
Year: 2017 PMID: 28340521 PMCID: PMC5364129 DOI: 10.1186/s11671-017-1963-6
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Fig. 1The synthesis process of silver nanowires (a), SEM (b), TEM (c), UV-vis-NIR absorption spectra (d), and XRD pattern of silver nanowires (e)
Fig. 2SEM images of silver nanowires synthesized by adjusting the concentration of AgNO3 a 0.5 times, b 1 times, c 2 times, and d 5 times
Fig. 3Transmittance vs wavelength plot for thin film by different volumes of Ag nanowire solution, and transmittance vs sheet resistance plot of silver nanowire film with different densities of Ag nanowires
Fig. 4The SEM (a) and AFM (b) image of the transparent conducting thin film, flexible (c), and electron property test (d)