Literature DB >> 28340394

Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetry.

L C Gontard1, J D López-Castro2, L González-Rovira2, J M Vázquez-Martínez3, F M Varela-Feria4, M Marcos3, J J Calvino5.   

Abstract

We describe a methodology to obtain three-dimensional models of engineered surfaces using scanning electron microscopy and multi-view photogrammetry (3DSEM). For the reconstruction of the 3D models of the surfaces we used freeware available in the cloud. The method was applied to study the surface roughness of metallic samples patterned with parallel grooves by means of laser. The results are compared with measurements obtained using stylus profilometry (PR) and SEM stereo-photogrammetry (SP). The application of 3DSEM is more time demanding than PR or SP, but it provides a more accurate representation of the surfaces. The results obtained with the three techniques are compared by investigating the influence of sampling step on roughness parameters.
Copyright © 2017 Elsevier B.V. All rights reserved.

Keywords:  3DSEM; Patterned surfaces; Photogrammetry; Profilometry; Roughness; SEM metrology; Stereo-photogrammetry

Year:  2017        PMID: 28340394     DOI: 10.1016/j.ultramic.2017.03.007

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  2 in total

1.  Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry.

Authors:  Vipin N Tondare; John S Villarrubia; András E Vladár
Journal:  Microsc Microanal       Date:  2017-09-18       Impact factor: 4.127

2.  Three-dimensional chemical mapping using non-destructive SEM and photogrammetry.

Authors:  Lionel C Gontard; Moisés Batista; Jorge Salguero; José J Calvino
Journal:  Sci Rep       Date:  2018-07-20       Impact factor: 4.379

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.