| Literature DB >> 28336845 |
Xuesong Yuan1, Matthew T Cole2, Yu Zhang3, Jianqiang Wu4, William I Milne5, Yang Yan6.
Abstract
Here, we investigate, through parametrically optimized macroscale simulations, the field electron emission from arrays of carbon nanotube (CNT)-coated Spindts towards the development of an emerging class of novel vacuum electron devices. The present study builds on empirical data gleaned from our recent experimental findings on the room temperature electron emission from large area CNT electron sources. We determine the field emission current of the present microstructures directly using particle in cell (PIC) software and present a new CNT cold cathode array variant which has been geometrically optimized to provide maximal emission current density, with current densities of up to 11.5 A/cm² at low operational electric fields of 5.0 V/μm.Entities:
Keywords: carbon nanotube; cold cathode; electron gun; field emission
Year: 2017 PMID: 28336845 PMCID: PMC5295203 DOI: 10.3390/nano7010013
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1Fitting, simulation, and experimental results. (a) Fitting and experimental current density as a function of global electric field. Inset: Scheme depicting the truncated-Spindt carbon nanotube cold cathode electron source; (b) Simulation and experimental for a generalized square emitter confirming the commutability of the Fowler–Nordheim (FN) coefficient extraction processed outlined. Inset: simulation geometry.
Figure 2Single carbon nanotube (CNT)-coated Spindt field emission. (a) Surface electric field as a function of Spindt height. Inset: single Spindt geometry. (b) The maximum field enhancement factor βmax, extracted from the geometry terms, as a function of h and r1. (c) Simulated emission from a single Spindt CNT cold cathode. Inset: beam trajectories.
Figure 3Simulated CNT-coated Spindt cold cathode array.
Figure 4Field emission current density as a function of h and D. Under low-bias (35 V), (a) r1 = 0.50 μm and (b) r1 = 0.75 μm; under high-bias (50 V), (c) r1 = 1.00 μm and (d) r1 = 1.25 μm.