Literature DB >> 28306281

Lattice Location of Mg in GaN: A Fresh Look at Doping Limitations.

U Wahl1, L M Amorim2, V Augustyns2, A Costa1, E David-Bosne1, T A L Lima2, G Lippertz2, J G Correia1, M R da Silva3, M J Kappers4, K Temst2, A Vantomme2, L M C Pereira2.   

Abstract

Radioactive ^{27}Mg (t_{1/2}=9.5  min) was implanted into GaN of different doping types at CERN's ISOLDE facility and its lattice site determined via β^{-} emission channeling. Following implantations between room temperature and 800 °C, the majority of ^{27}Mg occupies the substitutional Ga sites; however, below 350 °C significant fractions were also found on interstitial positions ∼0.6  Å from ideal octahedral sites. The interstitial fraction of Mg was correlated with the GaN doping character, being highest (up to 31%) in samples doped p type with 2×10^{19}  cm^{-3} stable Mg during epilayer growth, and lowest in Si-doped n-GaN, thus giving direct evidence for the amphoteric character of Mg. Implanting above 350 °C converts interstitial ^{27}Mg to substitutional Ga sites, which allows estimating the activation energy for migration of interstitial Mg as between 1.3 and 2.0 eV.

Entities:  

Year:  2017        PMID: 28306281     DOI: 10.1103/PhysRevLett.118.095501

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  1 in total

1.  Realization of p-type gallium nitride by magnesium ion implantation for vertical power devices.

Authors:  Ya-Ting Shi; Fang-Fang Ren; Wei-Zong Xu; Xuanhu Chen; Jiandong Ye; Li Li; Dong Zhou; Rong Zhang; Youdou Zheng; Hark Hoe Tan; Chennupati Jagadish; Hai Lu
Journal:  Sci Rep       Date:  2019-06-19       Impact factor: 4.379

  1 in total

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