Literature DB >> 28244512

Spectroscopic evidence for the origin of odd-even effects in self-assembled monolayers and effects of substrate roughness.

Jiahao Chen1, Jian Liu2, Ian D Tevis3, Richard S Andino2, Christina M Miller2, Lawrence D Ziegler2, Xin Chen2, Martin M Thuo1.   

Abstract

This paper reports the effects of substrate roughness on the odd-even effect in n-alkanethiolate self-assembled monolayers (SAMs) probed by vibrational sum frequency generation (SFG) spectroscopy. By fabricating SAMs on surfaces across the so-called odd-even limit, we demonstrate that differentiation of the vibrational frequencies of CH3 from SAMs derived from alkyl thiols with either odd (SAMO) or even (SAME) numbers of carbons depends on the roughness of the substrate on which they are formed. Odd-even oscillation in SFG susceptibility amplitudes was observed for spectra derived from SAME and SAMO fabricated on flat surfaces (RMS roughness = 0.4 nm) but not on rougher surfaces (RMS roughness = 2.38 nm). In addition, we discovered that local chemical environments for the terminal CH3 group have a chain-length dependence. There seems to be a transition at around C13, beyond which SAMs become "solid-like".

Entities:  

Year:  2017        PMID: 28244512     DOI: 10.1039/c6cp07580k

Source DB:  PubMed          Journal:  Phys Chem Chem Phys        ISSN: 1463-9076            Impact factor:   3.676


  1 in total

1.  Role of Nanoscale Roughness and Polarity in Odd-Even Effect of Self-Assembled Monolayers.

Authors:  Chuanshen Du; Zhengjia Wang; Jiahao Chen; Andrew Martin; Dhruv Raturi; Martin Thuo
Journal:  Angew Chem Int Ed Engl       Date:  2022-06-01       Impact factor: 16.823

  1 in total

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