| Literature DB >> 2822548 |
Abstract
Time profiles for degradation of DNA via reaction of H2O2 with the DNA-Cu+ complex were analyzed over a wide range of concentrations of the components. The yield of DNA damage per H2O2 molecule is 10 times lower than that obtained with gamma-radiolytically generated .OH radicals. The observations can be explained by a model in which H2O2 reacts, slowly on the one hand with DNA-Cu+ by formation of toxic .OH radicals immediately at the DNA and faster on the other hand with Cu+ in the bulk solution by formation of less toxic Cu(III) intermediates.Entities:
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Year: 1987 PMID: 2822548 DOI: 10.1016/s0891-5849(87)80003-5
Source DB: PubMed Journal: Free Radic Biol Med ISSN: 0891-5849 Impact factor: 7.376