| Literature DB >> 28191412 |
Ellen Kim1, Ji Hyun Lee1, Jin Kwon Kim1, Gun Ho Lee2, Kangho Ahn2, Jung Duck Park3, Il Je Yu1.
Abstract
BACKGROUND: With the ever-increasing development of nanotechnology, our society is being surrounded by possible risks related to exposure to manufactured nanomaterials. The consumer market already includes many products that contain silver nanoparticles (AgNPs), including various household products, such as yoga mats, cutting boards, running shirts, and socks. There is a growing concern over the release of AgNPs in workplaces related to the manufacture and application of nanomaterials.Entities:
Year: 2016 PMID: 28191412 PMCID: PMC5271149 DOI: 10.1186/s40580-016-0065-y
Source DB: PubMed Journal: Nano Converg ISSN: 2196-5404
Fig. 1Schematic diagram of exposure simulation chamber
Fig. 2TEM-EDS (transmission electron microscopy) analysis of nanosilver ink. a TEM picture; b EDS; c count median diameter of silver nanoparticles
Inhalation exposure to silver nanoparticles (μg/m3)
| Ag concentration | ||||||
|---|---|---|---|---|---|---|
| Sample no | Pump flow rate (L/min) | Sampling time (min) | Ag conc (μg/m3) | MOE | MOEa | |
| 1st day | Exp 1 | 1.98 | 180 | 0.02 | 7600 | 38,000 |
| Exp 2 | 2.00 | 180 | 0.02 | |||
| Exp 3 | 1.92 | 180 | 0.02 | |||
| Exp 4 | 2.00 | 180 | 0.01 | |||
| 2nd day | Exp 1 | 1.94 | 180 | 0.01 | 13,300 | 66,500 |
| Exp 2 | 1.91 | 180 | 0.01 | |||
| Exp 3 | 2.01 | 180 | 0.01 | |||
| Exp 4 | 2.00 | 180 | 0.01 | |||
| 3rd day | Exp 1 | 1.97 | 180 | 0.01 | 10,640 | 53,200 |
| Exp 2 | 1.93 | 180 | 0.01 | |||
| Exp 3 | 2.07 | 180 | 0.01 | |||
| Exp 4 | 2.01 | 180 | 0.02 | |||
| Work placeb | Personal 1 | 0.953 | 123 | 0.00024 | 554,166 | 2,770,833 |
MOE NOAEL/Exposure concentration, MOE with use of personal protective equipment, 80 % reduction in inhalation exposure, NOAEL 133 μg/m3 Sung et al. [6]
bData obtained from Lee et al. [3]
Fig. 3Particle distribution and number concentration during operation of printed electronics printer. a Measured using dust monitor and CPC; b measured using SMPS