Literature DB >> 28170114

Validation of the Chinese version of Addenbrooke's Cognitive Examination III for diagnosing dementia.

Bian-Rong Wang1, Zhou Ou2, Xiao-Hua Gu3, Cun-Sheng Wei4, Jun Xu5, Jian-Quan Shi2.   

Abstract

OBJECTIVE: The aim of this study was to validate the reliability of the Chinese version of Addenbrooke's Cognitive Examination III (ACE-III) for detecting dementia. Furthermore, the present study compares the diagnostic accuracy of ACE-III with that of mini-mental state examination (MMSE).
METHODS: One hundred seventy-seven patients with dementia and 180 healthy controls were included in the study.
RESULTS: The reliability of ACE-III was very good (α-coefficient = 0.888). There was a significant negative correlation between Clinical Dementia Rating Scale score and total ACE-III score. Further, there was a positive correlation between MMSE score and total ACE-III score. Age exerted a significant effect on total ACE-III score, memory score, and language score. In the present study, the cutoff score of 83 showed a sensitivity of 91.1% and a specificity of 83.1%.
CONCLUSIONS: The present findings support that the Chinese version of ACE-III is a reliable assessment tool for dementia.
Copyright © 2017 John Wiley & Sons, Ltd. Copyright © 2017 John Wiley & Sons, Ltd.

Entities:  

Keywords:  Addenbrooke's Cognitive Examination III; Chinese; cognitive evaluation; dementia

Mesh:

Year:  2017        PMID: 28170114     DOI: 10.1002/gps.4680

Source DB:  PubMed          Journal:  Int J Geriatr Psychiatry        ISSN: 0885-6230            Impact factor:   3.485


  11 in total

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6.  Comparative diagnostic accuracy of ACE-III and MoCA for detecting mild cognitive impairment.

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7.  Evaluation of sensitivity and specificity of the INECO Frontal Screening and the Frontal Assessment Battery in mild cognitive impairment.

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10.  Hindi Version of Addenbrooke's Cognitive Examination III: Distinguishing Cognitive Impairment Among Older Indians at the Lower Cut-Offs.

Authors:  Swati Bajpai; Ashish Upadhyay; Hemchand Sati; R M Pandey; Prasun Chaterjee; A B Dey
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