| Literature DB >> 28165747 |
S Assali1, A Dijkstra1, A Li1,2,3, S Koelling1, M A Verheijen1,4, L Gagliano1, N von den Driesch5, D Buca5, P M Koenraad1, J E M Haverkort1, E P A M Bakkers1,2.
Abstract
Group IV semiconductor optoelectronic devices are now possible by using strain-free direct band gap GeSn alloys grown on a Ge/Si virtual substrate with Sn contents above 9%. Here, we demonstrate the growth of Ge/GeSn core/shell nanowire arrays with Sn incorporation up to 13% and without the formation of Sn clusters. The nanowire geometry promotes strain relaxation in the Ge0.87Sn0.13 shell and limits the formation of structural defects. This results in room-temperature photoluminescence centered at 0.465 eV and enhanced absorption above 98%. Therefore, direct band gap GeSn grown in a nanowire geometry holds promise as a low-cost and high-efficiency material for photodetectors operating in the short-wave infrared and thermal imaging devices.Entities:
Keywords: Semiconductor nanowire; absorption; direct band gap; germanium tin; photoluminescence
Year: 2017 PMID: 28165747 DOI: 10.1021/acs.nanolett.6b04627
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189