| Literature DB >> 28155920 |
Tianle Guo1, Siddharth Sampat1, Kehao Zhang2, Joshua A Robinson2, Sara M Rupich3, Yves J Chabal3, Yuri N Gartstein1, Anton V Malko1.
Abstract
Two-dimensional transition metal dichalcogenides (TMDCs) like MoS2 are promising candidates for various optoelectronic applications. The typical photoluminescence (PL) of monolayer MoS2 is however known to suffer very low quantum yields. We demonstrate a 10-fold increase of MoS2 excitonic PL enabled by nonradiative energy transfer (NRET) from adjacent nanocrystal quantum dot (NQD) films. The understanding of this effect is facilitated by our application of transient absorption (TA) spectroscopy to monitor the energy influx into the monolayer MoS2 in the process of ET from photoexcited CdSe/ZnS nanocrystals. In contrast to PL spectroscopy, TA can detect even non-emissive excitons, and we register an order of magnitude enhancement of the MoS2 excitonic TA signatures in hybrids with NQDs. The appearance of ET-induced nanosecond-scale kinetics in TA features is consistent with PL dynamics of energy-accepting MoS2 and PL quenching data of the energy-donating NQDs. The observed enhancement is attributed to the reduction of recombination losses for excitons gradually transferred into MoS2 under quasi-resonant conditions as compared with their direct photoproduction. The TA and PL data clearly illustrate the efficacy of MoS2 and likely other TMDC materials as energy acceptors and the possibility of their practical utilization in NRET-coupled hybrid nanostructures.Entities:
Year: 2017 PMID: 28155920 PMCID: PMC5290460 DOI: 10.1038/srep41967
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) PL intensity of NQD/MoS2 hybrid at several pump levels on the log scale. (b) Magnified view of the MoS2 PL emission region in the hybrid samples. Black solid line - fit of the top trace using Gaussian (red dashed line) for MoS2 PL peak and two exponentials for Urbach-like sub-band gap emission in NQDs (black dashed line) and in MoS2 (part of the fit line in 690–720 nm region) (c) PL of the bare monolayer MoS2 reference sample at the same power levels. The large increase of PL intensity is quantified in panel (d) in the form of the PL enhancement factor (ratio of MoS2 PL intensities in panels (b,c)) as a function of the pulse fluence. (e) Time-resolved PL decays for the hybrid at 676 nm fitted by double-exponentials and compared to the PL decay in the reference sample.
Figure 2Schematic pictures of the pump-probe measurements setup and ET in hybrid NQD/MoS2 samples accompanied by the data plots.
(a) Pump-probe spectra of the NQD/MoS2 hybrids for different time delays Δt at ~1 mJ/cm2 pulse fluence. (b) Dynamics of the A-exciton bleaching feature in the hybrid (red trace) and reference MoS2 (blue trace) samples. Black line shows the fit using Eq. (5) yielding the parameter ratio . (c) Dynamics of the B-exciton bleaching feature in the hybrid (green trace) and reference MoS2 (blue trace) samples. Black line shows the fit by a tri-exponential function with 10, 60 and 1000 ps time constants. (d) The MoS2 exciton 660 nm bleach amplitude at Δt = 150 ps in the hybrid sample vs the NQD PL intensity at 585 nm for the same pump fluences in the range of Neh from 0.1 to 2.
Figure 3Results of illustrative model calculations using optical parameters discussed in refs 20 and 25.
(a) Optical properties of the air/NQD/MoS2/sapphire/air structure for the 400 nm wavelength as a function of the NQD film thickness. Shown are the percentage amounts of the absorption in monolayer MoS2 and in the NQD film as well as the total reflectance and transmittance of the structure for the normally incident light. (b) The efficiency of energy transfer into MoS2 for the 585 nm wavelength as a function of distance h of randomly oriented electric-dipole emitter from the interface with monolayer MoS2. The inset in the double-logarithmic scale shows the distance dependence of the ET rates visually compared to power-laws of h−3 and h−4 displayed as short-dash lines. Solid lines show results for the interface between sapphire and vacuum, dash lines for the interface between sapphire and the medium with refraction index of 1.6 representative of dense NQD films20.