| Literature DB >> 28144503 |
Gianlorenzo Bussetti1, Alberto Calloni1, Rossella Yivlialin1, Andrea Picone1, Federico Bottegoni1, Marco Finazzi1.
Abstract
Zn-tetraphenylporphyrin (Zn-TPP) was deposited on a single layer of metal oxide, namely an Fe(001)-p(1×1)O surface. The filled and empty electronic states were measured by means of UV photoemission and inverse photoemission spectroscopy on a single monolayer and a 20 monolayer thick film. The ionization energy and the electron affinity of the organic film were deduced and the interface dipole was determined and compared with data available in the literature.Entities:
Keywords: OMBE; inverse photoemission; metal-oxide film; porphyrin
Year: 2016 PMID: 28144503 PMCID: PMC5238660 DOI: 10.3762/bjnano.7.146
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.649
Figure 1The structure of the Zn-tetraphenylporphyrin molecule. The main inner cavity of the porphyrin (ring) as well as the four phenyl groups have been marked in the image.
Figure 2Filled (black lines) and empty (red lines) states acquired on freshly prepared Fe(001)-p(1×1)O for 1 ML and 20 ML thick Zn-TPP samples.
Figure 3Energy of molecular levels near the interface between Fe(001)-p(1×1)O and the (a) 20 ML thick Zn-TPP film and (b) 1 ML thick Zn-TTP film. The interface dipole, work function of the bare substrate, and Zn-TPP ionization energy are indicated.
Binding energy position of both filled and empty molecular levels as a function of the porphyrin film thickness.
| 1 ML thick sample | 20 ML thick sample | |
| R-HOMO | 1.50 ± 0.01 eV | 1.76 ± 0.01 eV |
| Ph-HOMO | 3.80 ± 0.01 eV | 4.00 ± 0.01 eV |
| R-LUMO | 0.6 ± 0.3 eV | 0.8 ± 0.3 eV |
| Ph-LUMO | 3.6 ± 0.3 eV | 3.7 ± 0.3 eV |