| Literature DB >> 28042375 |
Kanchan Bisht1, Kaushik Sharma1, Baptiste Lacoste2, Marie-Ève Tremblay1.
Abstract
Using transmission electron microscopy (TEM) we recently characterized a microglial phenotype that is induced by chronic stress, fractalkine receptor deficiency, aging, or Alzheimer disease pathology. These 'dark' microglia appear overly active compared with the normal microglia, reaching for synaptic clefts, and extensively engulfing pre-synaptic axon terminals and post-synaptic dendritic spines. From these findings we hypothesized that dark microglia could be specifically implicated in the pathological remodeling of neuronal circuits, which impairs learning, memory, and other essential cognitive functions. In the present addendum we further discuss about the possible causes of their dark appearance under TEM.Entities:
Keywords: Alzheimer disease; aging; dark microglia; electron microscopy; fractalkine receptor deficiency; microglia; oxidative stress; synapses
Year: 2016 PMID: 28042375 PMCID: PMC5193044 DOI: 10.1080/19420889.2016.1230575
Source DB: PubMed Journal: Commun Integr Biol ISSN: 1942-0889